Nanotechnology Now

Our NanoNews Digest Sponsors







Heifer International

Wikipedia Affiliate Button


Home > Press > IBM Scientists Effectively Eliminate Wear at the Nanoscale

Scanning electron micrograph showing no measurable mechanical wear in a vibrating nanotip sliding 750-meters over a polymer surface. The tip measures 500 nanometers in length and only 5 nanometers at its apex. On the left is the original tip, on the right the same tip after the 750-meter wear test. The red line shows the outline of the original tip shape overlayed on an image taken at the end of the experiment. The key to success: A small almost imperceptible vibration of the tip. 

Image courtesy of IBM Research - Zurich
Scanning electron micrograph showing no measurable mechanical wear in a vibrating nanotip sliding 750-meters over a polymer surface. The tip measures 500 nanometers in length and only 5 nanometers at its apex. On the left is the original tip, on the right the same tip after the 750-meter wear test. The red line shows the outline of the original tip shape overlayed on an image taken at the end of the experiment. The key to success: A small almost imperceptible vibration of the tip. Image courtesy of IBM Research - Zurich

Abstract:
Results could lead to new high-precision and high-quality nanomechanical tools in nanofabrication and in the development of next-generations chips

IBM Scientists Effectively Eliminate Wear at the Nanoscale

Zurich, Switzerland | Posted on September 8th, 2009

IBM (NYSE: IBM) scientists have demonstrated a promising and practical method that effectively eliminates the mechanical wear in the nanometer-sharp tips used in scanning probe-based techniques. This discovery can potentially be used in the development of next generation, more advanced computer chips that have higher performance and smaller feature sizes. Scanning probe-based tools could be one approach to extend the capabilities, quality and precision beyond the projected limits of current production and characterization tools.

Scanning probe-based techniques utilize tiny, nanometer-sharp tips borrowed from atomic force microscopy to manipulate nanostructures and devices by scanning or rather sliding in very close proximity over the surface—similar to the way the needle of a record player on a record. Today, these techniques—including for example the well-known atomic force microscope—are established tools for scientists to explore the nanocosmos. Scanning-probe techniques today allow for the highest possible resolution down to the atomic or molecular scale and represent essentially the scientists' "eyes", "ears", "nose", and "hands" as they explore the smallest objects known to mankind.

In the semiconductor industry, these techniques due to their atomic resolution and manipulation capabilities become increasingly attractive for use in the development and manufacturing of next generation chips with ultra-small feature sizes. While small by most standards, today's 40 nm transistors can still shrink further, but it becomes increasingly challenging and costly since the current tools and methods to develop and process the chips out of silicon wafers approach physical limitations for critical chip layers.

"Continued scaling to further increase device performance will require new device architectures, smaller feature sizes and new materials. Tools based on scanning probe technology could become essential for the metrology of future technology nodes as well as for the development, fabrication and characterization of novel nanoscale devices," says IBM Fellow Evangelos Eleftheriou of IBM Research - Zurich.

A key limiting factor for the prospects of large-scale industrial uses of such techniques, however, has been mechanical wear of the sharp tips. Wear resulting from friction between moving parts are inherent to all mechanical processes on the macro- as well as on the nanometer-scale. However, for scanning probe-based technologies, which rely on a nanometer-sharp tip—measuring just five nanometers at its apex—this problem is accentuated. A few cubic nanometers more or less can ruin the sensitivity of the tip. "In future industrial applications such as large area characterization of the features on a silicon wafer, a tip would need to be able to slide tens of kilometers or miles without replacement," explains IBM scientist Mark Lantz. In the currently used scanning modes, the tip wears out after a few meters or yards. "Moreover, in addition to causing wear of the tip, friction can potentially also do damage to the surface being characterized."

In their paper, published in the September issue of Nature Nanotechnology, IBM scientists solve this challenge by "demonstrating the effective elimination of wear on a tip sliding on a polymer surface over a distance of 750 meters by modulating the force acting on the tip-sample contact." By applying an AC voltage between the cantilever—the mechanical arms on which the tips are attached and over which they are controlled—and the sample surface, the cantilever can be excited at high frequencies of one Megahertz. The cantilever bends and the tip vibrates with an almost imperceptible estimated amplitude of one nanometer. "Though vanishingly small, it is this vibration that greatly reduces friction and "effectively" eliminates—to below the detection limit corresponding to the remarkable low number of losing one atom per meter—tip wear under experimental conditions," states Bernd Gotsmann of IBM Research - Zurich. After the 750-meter wear test, which took a week of continuous operation, the tip was still operating flawlessly.

With the wear problem tackled, researchers at IBM Research - Zurich are now investigating a number of possible applications of scanning probe-based technologies including nanofabrication, nanolithography and high-speed metrology. Operating a large number of tips in parallel would enable, high-throughput, high-speed, automated metrology systems for potential use in chip development and manufacturing. Such metrology systems could characterize device dimensions or identify defects on the structured silicon wafers with much higher precision and accuracy and potentially lower cost than currently available tools. Scientists at IBM Research - Zurich are also investigating powerful scanning probe-based method for high speed patterning of complex two and three-dimensional nanoscale structures.

The scientific paper entitled "Dynamic Superlubricity and the Elimination of Wear on the Nanoscale" by M.A. Lantz, D. Wiesmann, and B. Gotsmann, is published in Nature Nanotechnology, Volume 4, Issue 9 (September 2009).

####

For more information, please click here

Contacts:
Nicole Herfurth
Media Relations
IBM Research GmbH
IBM Research - Zurich
Säumerstrasse 4
8803 Rüschlikon
Switzerland

Tel +41 44 724 8445
Fax +41 44 724 8952

Copyright © http://www.zurich.ibm.com

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

Pioneering breakthrough of chemical nanoengineering to design drugs controlled by light June 18th, 2013

Study Shows How the Nanog Protein Promotes Growth of Head and Neck Cancer June 18th, 2013

New Method to Synthesize Zinc Oxide Nanoparticles with High Catalytic Activity June 18th, 2013

Production of Polyaniline Biosensors Modified with Conductive Polymer Composites June 18th, 2013

Possible Futures

Space Solar Power: Key to a Livable Planet Earth June 10th, 2013

Global Nanotechnology Drug Delivery Market 2012-2016 June 10th, 2013

Nanorobot tetanus treatment animation June 9th, 2013

New horizons to drive the future of Medicine: European Technology Platform on Nanomedicine intends to lead the domain June 8th, 2013

Chip Technology

Which qubit my dear? New method to distinguish between neighbouring quantum bits June 18th, 2013

SEMATECH to Address Critical Supply Chain Challenges and Present Latest Technology Advances at SEMICON West 2013 June 17th, 2013

Imec shows multiple enhancement options for next-generation FinFETs: Leading nano-electronics R&D center addresses key challenges of Germanium finFET technology at VLSI 2013 June 14th, 2013

Imec showcases innovation in RRAM R&D at VLSI Technology Symposium June 14th, 2013

Nanotubes/Buckyballs

Unzipped nanotubes unlock potential for batteries: Rice University lab combines graphene nanoribbons with tin oxide for improved anodes June 13th, 2013

The Diabetes ‘Breathalyzer’: Pitt chemists demonstrate sensor technology that could detect and monitor diabetes through breath analysis alone June 10th, 2013

Los Alamos catalyst could jumpstart e-cars, green energy: The new material has the highest oxygen reduction reaction (ORR) activity in alkaline media of any non-precious metal catalyst developed to date June 4th, 2013

Even with Defects, Graphene is Strongest Material in the World: New Study Reveals Strength of CVD Graphene May 31st, 2013

Nanoelectronics

Imec shows multiple enhancement options for next-generation FinFETs: Leading nano-electronics R&D center addresses key challenges of Germanium finFET technology at VLSI 2013 June 14th, 2013

Controlling magnetic clouds in graphene June 14th, 2013

Spot-welding graphene nanoribbons atom by atom June 13th, 2013

World's first large(wafer)-scale production of III-V semiconductor nanowire June 10th, 2013

Discoveries

Which qubit my dear? New method to distinguish between neighbouring quantum bits June 18th, 2013

Pioneering breakthrough of chemical nanoengineering to design drugs controlled by light June 18th, 2013

Study Shows How the Nanog Protein Promotes Growth of Head and Neck Cancer June 18th, 2013

New Method to Synthesize Zinc Oxide Nanoparticles with High Catalytic Activity June 18th, 2013

Announcements

Pioneering breakthrough of chemical nanoengineering to design drugs controlled by light June 18th, 2013

Study Shows How the Nanog Protein Promotes Growth of Head and Neck Cancer June 18th, 2013

New Method to Synthesize Zinc Oxide Nanoparticles with High Catalytic Activity June 18th, 2013

Production of Polyaniline Biosensors Modified with Conductive Polymer Composites June 18th, 2013

Tools

Which qubit my dear? New method to distinguish between neighbouring quantum bits June 18th, 2013

Pioneering breakthrough of chemical nanoengineering to design drugs controlled by light June 18th, 2013

METTLER TOLEDO launches new microgram weights Combined with unique calibration service from the UK's NMO June 17th, 2013

Hitachi announces the SU8200 – a new type of cold field emitter SEM June 17th, 2013

NanoNews-Digest
The latest news from around the world, FREE







  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More












ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project








abbigliamento uomo
Computer Accessories
© Copyright 1999-2013 7th Wave, Inc. All Rights Reserved PRIVACY POLICY :: CONTACT US :: STATS :: SITE MAP :: ADVERTISE