Nanotechnology Now

Our NanoNews Digest Sponsors



Heifer International

Wikipedia Affiliate Button


android tablet pc

Home > Press > FEI Introduces New Solution for Gunshot Residue Analysis in Forensics

Abstract:
GSR S50 & GSR F50 Provide Fully-Automated Analysis With Dramatic Improvements in Speed, Accuracy and Affordability

FEI Introduces New Solution for Gunshot Residue Analysis in Forensics

Hillsboro, OR | Posted on September 2nd, 2009

FEI Company (Nasdaq:FEIC), a leading provider of high-resolution imaging and analysis systems, today announced the release of two dedicated scanning electron microscopes (SEMs) and a new software package for automated analysis of gunshot residues (GSR). Forensic scientists use GSR analysis to match residues from victims and suspects. The new GSR S50 and GSR F50 SEMs include the newly-released Magnum(tm) GSR software and specially-modified hardware to provide fully-automated analysis with dramatic improvements in speed, accuracy and affordability.

"These new systems are specifically designed to address the needs of forensic laboratories for fast, reliable analysis," said Paul Scagnetti, vice president and general manager of FEI's Industry Division. "GSR analysis can be a long and tedious process, yet the results are often used to make life and death decisions. The S50 and F50 completely automate the analysis procedure reducing opportunity for operator error. The systems include dedicated validation routines for accurate results. In addition, optimal use of the SEM's imaging capabilities and features, such as the beam current booster, give faster, more repeatable results."

GSR analysis uses high-resolution SEM imaging to locate residue particles, and X-ray spectrometry to determine their elemental composition. The GSR S50's ability to image uncoated samples in low vacuum mode helps preserve sample integrity. The GSR F50's field emission source delivers higher spatial resolution and puts more beam current into a smaller spot for faster, more precise X-ray analysis.

The new Magnum GSR software, included in both systems, uses the SEM's native imaging capabilities to locate particles, which is a much faster method than the conventional approach that uses the X-ray system to control the particle imaging and detection process. A specially-designed beam current booster (BCB) increases beam current during X-ray data acquisition to improve the speed and precision of the analysis. To help optimize price/performance, both systems are fully compatible with the latest high count rate silicon drift X-ray detectors from Bruker Corporation and EDAX. They also include built-in validation procedures that use the latest standard layouts of the ENFSI proficiency tests.

FEI Safe Harbor Statement

This news release contains forward-looking statements that include statements regarding the performance capabilities, return on investment and benefits of the GSR S50, GSR F50 and Magnum GSR Software. Factors that could affect these forward-looking statements include but are not limited to failure of the product or technology to perform as expected and achieve anticipated results, unexpected technology problems and our ability to manufacture, ship and deliver the tools as expected. Please also refer to our Form 10-K, Forms 10-Q, Forms 8-K and other filings with the U.S. Securities and Exchange Commission for additional information on these factors and other factors that could cause actual results to differ materially from the forward-looking statements. FEI assumes no duty to update forward-looking statements.

####

About FEI
FEI (Nasdaq:FEIC) is a leading diversified scientific instruments company. It is a premier provider of electron and ion-beam microscopes and tools for nanoscale applications across many industries: industrial and academic materials research, life sciences, semiconductors, data storage, natural resources and more. With a 60-year history of technological innovation and leadership, FEI has set the performance standard in transmission electron microscopes (TEM), scanning electron microscopes (SEM) and DualBeams(tm), which combine a SEM with a focused ion beam (FIB). FEI's imaging systems provide 3D characterization, analysis and modification/prototyping with resolutions down to the sub-Angstrom (one-tenth of a nanometer) level. FEI's NanoPorts in North America, Europe and Asia provide centers of technical excellence where its world-class community of customers and specialists collaborate. FEI has approximately 1800 employees and sales and service operations in more than 50 countries around the world.

For more information, please click here

Contacts:
MindWrite
Communications, Inc
Media Contact
Sandy Fewkes, Principal
+1 408 224 4024


FEI Company
Investors and Analysts
Investor Relations
Fletcher Chamberlin
+1 503 726 7710

Copyright © FEI

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

Arrowhead to Present at BioCentury's NewsMakers in the Biotech Industry Conference September 19th, 2014

SouthWest NanoTechnologies (SWeNT) Receives NIST Small Business Innovation Research (SBIR) Phase 1 Award to Produce Greater than 99% Semiconducting Single-Wall Carbon Nanotubes September 19th, 2014

Toward optical chips: A promising light source for optoelectronic chips can be tuned to different frequencies September 19th, 2014

New research points to graphene as a flexible, low-cost touchscreen solution September 19th, 2014

Laboratories

Elusive Quantum Transformations Found Near Absolute Zero: Brookhaven Lab and Stony Brook University researchers measured the quantum fluctuations behind a novel magnetic material's ultra-cold ferromagnetic phase transition September 15th, 2014

'Squid skin' metamaterials project yields vivid color display: Rice lab creates RGB color display technology with aluminum nanorods September 15th, 2014

Berkeley Lab Licenses Boron Nitride Nanotube Technology: New material has unique mechanical and electronic properties September 13th, 2014

Advanced Light Source Sets Microscopy Record| Berkeley Lab Researchers Achieve Highest Resolution Ever with X-ray Microscopy September 11th, 2014

Law enforcement/Anti-Counterfeiting/Security/Loss prevention

Light detector to revolutionise night vision technology September 8th, 2014

Ultra-thin Detector Captures Unprecedented Range of Light September 7th, 2014

Nanotech Security Corp. to Acquire Fortress Optical Features Ltd., a Leading Producer of Banknote Security Features August 27th, 2014

Self-assembling nanoparticle could improve MRI scanning for cancer diagnosis: Scientists have designed a new self-assembling nanoparticle that targets tumours, to help doctors diagnose cancer earlier July 16th, 2014

Announcements

Arrowhead to Present at BioCentury's NewsMakers in the Biotech Industry Conference September 19th, 2014

SouthWest NanoTechnologies (SWeNT) Receives NIST Small Business Innovation Research (SBIR) Phase 1 Award to Produce Greater than 99% Semiconducting Single-Wall Carbon Nanotubes September 19th, 2014

Toward optical chips: A promising light source for optoelectronic chips can be tuned to different frequencies September 19th, 2014

New research points to graphene as a flexible, low-cost touchscreen solution September 19th, 2014

Tools

IEEE International Electron Devices Meeting To Celebrate 60th Anniversary as The Leading Technical Conference for Advanced Semiconductor Devices September 18th, 2014

FEI Opens New Technology Center in Czech Republic: FEI expands its presence in Brno with the opening of a new, larger facility September 18th, 2014

New NPZ100-403 Piezo Stage from nPoint Inc. September 17th, 2014

Researchers Create World’s Largest DNA Origami September 11th, 2014

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More














ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







© Copyright 1999-2014 7th Wave, Inc. All Rights Reserved PRIVACY POLICY :: CONTACT US :: STATS :: SITE MAP :: ADVERTISE