Nanotechnology Now

Our NanoNews Digest Sponsors


Heifer International

Wikipedia Affiliate Button


DHgate

Home > Press > Nanometrics Delivers Follow-On Unifire System to Leading Hard Drive Manufacturer

Abstract:
Nanometrics Incorporated (Nasdaq: NANO), a leading supplier of advanced process control metrology systems used primarily in the manufacturing of semiconductors, solar photovoltaics and high-brightness LEDs, today announced the delivery of a Unifire™ metrology system equipped with the
Advanced Film Capability (AFC) option.

Nanometrics Delivers Follow-On Unifire System to Leading Hard Drive Manufacturer

Milpitas, CA | Posted on July 14th, 2009

The Unifire technology configured with AFC enables the simultaneous, nondestructive measurement of film thickness and step height metrology within the industry's smallest test areas and targets. This system is a follow-on order currently being qualified to support a leading hard drive manufacturer's production capacity for advanced magnetic heads.

"We are pleased with the traction of the Unifire product in both the semiconductor and magnetic head manufacturing sectors. Unifire systems are being placed into specific segments that leverage the unique capabilities of the interferometer measurement technology," commented Michael Darwin, Vice President of the Unifire Product Group at Nanometrics. "Our customers are deploying the Unifire systems to monitor critical process parameters including device topography, film thickness and step height, many of which can only be observed non-destructively with our proprietary small-spot AFC technology."

Nanometrics' Unifire platform has been deployed across front-end manufacturing and advanced packaging processes in applications including lithography, etch, chemical mechanical polishing (CMP) and thin film deposition.

Forward Looking Statements

This press release contains forward-looking statements including, but not limited to, statements regarding the qualification and capabilities of Unifire metrology systems. Although Nanometrics believes that the expectations reflected in the forward-looking statements are reasonable,
actual results could differ materially from the expectations due to a variety of factors including difficulties with the qualification process. For additional information and considerations regarding the risks faced by Nanometrics, see its annual report on Form 10-K for the year ended December 27, 2008 as filed with the Securities and Exchange Commission, as well as
other periodic reports filed with the SEC from time to time. Nanometrics disclaims any obligation to update information contained in any forward-looking statement.

####

About Nanometrics
Nanometrics is a leader in the design, manufacture and marketing of high-performance process control metrology systems used primarily in the manufacturing of semiconductors, solar photovoltaics and high-brightness LEDs, as well as by customers in the silicon wafer and data storage industries. Nanometrics standalone and integrated metrology systems measure various thin film properties, critical dimensions, overlay control, topography, and optical, electrical and material properties, including the structural composition of silicon, compound semiconductor and photovoltaic devices, during various steps of the manufacturing process, from front end of line substrate manufacturing through die preparation for advanced packaging. These systems enable device manufacturers to improve yields, increase productivity and lower their manufacturing costs. The company maintains its headquarters in Milpitas, California, with sales and service offices worldwide. Nanometrics is traded on NASDAQ Global Market under the symbol NANO.

For more information, please click here

Contacts:
Nanometrics Contact:
Kevin Heidrich
408.545.6000 tel


Investor Relations Contact:
Claire McAdams
Headgate Partners LLC
530.265.9899 tel

Copyright © Nanometrics

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

Cooling graphene-based film close to pilot-scale production April 30th, 2016

Personal cooling units on the horizon April 29th, 2016

Exploring phosphorene, a promising new material April 29th, 2016

The Translational Research Center at the University Hospital of Erlangen in Germany uses the ZetaView from Particle Metrix to quantify extracellular vesicles such as exosomes April 28th, 2016

JPK reports on the use of a NanoWizard AFM system at the University of Kaiserslautern to study the interaction of bacteria with microstructured surfaces April 28th, 2016

Display technology/LEDs/SS Lighting/OLEDs

Hybrid nanoantennas -- next-generation platform for ultradense data recording April 28th, 2016

Manipulating light inside opaque layers April 24th, 2016

Highlights from the Graphene Flagship April 22nd, 2016

Thin films

Flipping a chemical switch helps perovskite solar cells beat the heat April 26th, 2016

Thin-film solar cells: How defects appear and disappear in CIGSe cells: Concentration of copper plays a crucial role April 23rd, 2016

Chip Technology

Cooling graphene-based film close to pilot-scale production April 30th, 2016

Exploring phosphorene, a promising new material April 29th, 2016

Researchers create a first frequency comb of time-bin entangled qubits: Discovery is a significant step toward multi-channel quantum communication and higher capacity quantum computers April 28th, 2016

NREL theory establishes a path to high-performance 2-D semiconductor devices April 27th, 2016

Nanoelectronics

Cooling graphene-based film close to pilot-scale production April 30th, 2016

Exploring phosphorene, a promising new material April 29th, 2016

With simple process, UW-Madison engineers fabricate fastest flexible silicon transistor April 21st, 2016

All powered up: UCI chemists create battery technology with off-the-charts charging capacity April 21st, 2016

Announcements

Cooling graphene-based film close to pilot-scale production April 30th, 2016

Personal cooling units on the horizon April 29th, 2016

Exploring phosphorene, a promising new material April 29th, 2016

The Translational Research Center at the University Hospital of Erlangen in Germany uses the ZetaView from Particle Metrix to quantify extracellular vesicles such as exosomes April 28th, 2016

Tools

Exploring phosphorene, a promising new material April 29th, 2016

JPK reports on the use of a NanoWizard AFM system at the University of Kaiserslautern to study the interaction of bacteria with microstructured surfaces April 28th, 2016

Chemists use DNA to build the world's tiniest thermometer April 27th, 2016

Bruker Introduces Dimension FastScan Pro Industrial AFM: Providing Nanometer-Resolution at High Scan Rates for up to 300-mm Samples April 26th, 2016

Solar/Photovoltaic

NREL finds nanotube semiconductors well-suited for PV systems April 27th, 2016

Flipping a chemical switch helps perovskite solar cells beat the heat April 26th, 2016

Manipulating light inside opaque layers April 24th, 2016

Thin-film solar cells: How defects appear and disappear in CIGSe cells: Concentration of copper plays a crucial role April 23rd, 2016

NanoNews-Digest
The latest news from around the world, FREE




  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More











ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







Car Brands
Buy website traffic