Nanotechnology Now

Our NanoNews Digest Sponsors



Heifer International

Wikipedia Affiliate Button


android tablet pc

Home > Press > Nano Measurement in the 3rd Dimension: PTB develops micro and nano coordinate measuring instrument for 3D objects

The micro probe used in the micro-nano CMM measures the form and the spacing of two reference spheres with diameters of two millimetres each. The figure shows a survey of the system and the proportions of measuring probe and measurement object in detail.
The micro probe used in the micro-nano CMM measures the form and the spacing of two reference spheres with diameters of two millimetres each. The figure shows a survey of the system and the proportions of measuring probe and measurement object in detail.

Abstract:
From the motion sensor to the computer chip - in many products of daily life components are used whose functioning is based on smallest structures of the size of thousandths - or even millionths - of millimetres. These micro and nano structures must be manufactured and assembled with the highest precision so that in the end, the overall system will function smoothly. Thereby, details are important - and therefore scientists at the Physikalisch-Technische Bundesanstalt (PTB) have developed a metrological scanning probe microscope into a micro and nano coordinate measuring instrument. This now allows dimensional quantities with nanometer resolution also to be measured on three-dimensional objects in an extraordinarily large measurement range of 25 mm x 25 mm x 5 mm. The new device is already extensively being used at PTB - to a large part for calibration orders from industry and research.

Nano Measurement in the 3rd Dimension: PTB develops micro and nano coordinate measuring instrument for 3D objects

Germany | Posted on July 6th, 2009

Often, such small dimensions can be grasped only when they are transferred to everyday life. If we assume, for example, that someone lost a cube of sugar within an area of 25 square kilometres - the new micro and nano coordinate measuring instrument would not only be able to find it, but it would also be able to determine its exact position and shape. This does not only apply to plane surfaces, but also to three-dimensional landscapes, for example if the cube of sugar were stuck to a steep wall.

As increasingly, components with structures in the micro- and nanometer range are being used in industry, dimensional metrology on such structures is becoming increasingly important. To meet the increasing requirements for 3D measurements of micro and nano structures, 3D measuring probes newly developed at PTB were incorporated in a metrological scanning probe microscope based on a commercial nano-positioning system with integrated laser displacement sensors of the company SIOS Messtechnik GmbH. The new functionalities given by the measuring probe and the software extend the scanning probe microscope to a metrological micro/nano coordinate measuring machine (CMM) which also allows 3D measurements conforming to standards to be performed on micro and nano structures.

International intercomparisons on step-height standards and lattice structures have shown that the measuring system is worldwide one of the most precise of its kind. For step heights, measurement uncertainties in the subnanometer range - and for measurements of the mean structure spacing on extensive lattice standards even in the range of 10 picometers - have been achieved and confirmed in comparison with optical diffraction measurements.

The new measuring instrument is available for dimensional precision measurements with nm resolution on 3D micro and nano structures such as micro gears, micro balls, hardness indenters and nano lattice standards as well as for comparisons of measures; moreover, it serves as a platform for research and development tasks. It is an important link between nano, micro and macro coordinate metrology.

####

About Physikalisch-Technische Bundesanstalt
The Physikalisch-Technische Bundesanstalt (PTB) is the national metrology institute providing scientific and technical services. PTB measures with the highest accuracy and reliability metrology as the core competence.

For more information, please click here

Contacts:
Dr. Gaoliang Dai
PTB Working Group 5.25 Scanning Probe Metrology
Tel.: +49531 592-5127

Copyright © Physikalisch-Technische Bundesanstalt

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

The mysterious 'action at a distance' between liquid containers November 26th, 2014

'Giant' charge density disturbances discovered in nanomaterials: Juelich researchers amplify Friedel oscillations in thin metallic films November 26th, 2014

Vegetable oil ingredient key to destroying gastric disease bacteria: In mice, therapeutic nanoparticles dampen H. pylori bacteria and inflammation that lead to ulcers and gastric cancer November 25th, 2014

Research yields material made of single-atom layers that snap together like Legos November 25th, 2014

Blu-ray disc can be used to improve solar cell performance: Data storage pattern transferred to solar cell increases light absorption November 25th, 2014

Imaging

Renishaw receives Queen's Award for spectroscopy developments November 25th, 2014

Announcements

The mysterious 'action at a distance' between liquid containers November 26th, 2014

'Giant' charge density disturbances discovered in nanomaterials: Juelich researchers amplify Friedel oscillations in thin metallic films November 26th, 2014

Vegetable oil ingredient key to destroying gastric disease bacteria: In mice, therapeutic nanoparticles dampen H. pylori bacteria and inflammation that lead to ulcers and gastric cancer November 25th, 2014

Research yields material made of single-atom layers that snap together like Legos November 25th, 2014

Tools

Renishaw receives Queen's Award for spectroscopy developments November 25th, 2014

JPK reports on the use of AFM and the CellHesion module to study plant cells at the University of Queensland November 25th, 2014

A*STAR SIMTech wins international award for breaking new ground in actuators: SIMTech invention can be used in an array of industries, and is critical for next generation ultra-precision systems November 24th, 2014

Professional AFM Images with a Three Step Click SmartScan by Park Systems Revolutionizes Atomic Force Microscopy by Automatizing the Imaging Process November 24th, 2014

NanoNews-Digest
The latest news from around the world, FREE




  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More












ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







© Copyright 1999-2014 7th Wave, Inc. All Rights Reserved PRIVACY POLICY :: CONTACT US :: STATS :: SITE MAP :: ADVERTISE