Nanotechnology Now

Our NanoNews Digest Sponsors







Heifer International

Wikipedia Affiliate Button


Home > Press > Nanometrics Receives Multi-System Atlas OCD Order from Leading Memory Manufacturer

Abstract:
Nanometrics Incorporated (Nasdaq: NANO), a leading supplier of advanced process control metrology systems used primarily in the manufacturing of semiconductors, solar photovoltaics and high-brightness LEDs, today announced a follow on order for multiple Atlas® metrology systems. These systems will be delivered within the second quarter of this year to a leading memory customer as part of its plan to leverage Nanometrics' technology across high-volume manufacturing lines, in support of film thickness, wafer stress/bow, and optical critical dimension (OCD) metrology.

Nanometrics Receives Multi-System Atlas OCD Order from Leading Memory Manufacturer

Milpitas, CA | Posted on May 28th, 2009

"This latest order, both in scale and timing, demonstrates that our technology is a critical component for the manufacturing of leading generation memory devices," commented Michael Fischer, Vice President of Sales at Nanometrics. "The OCD market is now established, as we've witnessed our customers increasingly migrating CD-SEM measurements over to Nanometrics' OCD solution due to its ability to measure 3-D complex structures directly on memory arrays. These Atlas systems, as equipped, will allow seamless transition between thin film and OCD metrology by incorporating the NanoCD™ suite and the industry-leading capability of NanoDiffract™. The NanoCD suite, launched last year, has increased the adoption and proliferation of our OCD solutions into high-volume manufacturing."

####

About Nanometrics Incorporated
Nanometrics is a leader in the design, manufacture and marketing of high-performance process control metrology systems used primarily in the manufacturing of semiconductors, solar photovoltaics and high-brightness LEDs, as well as by customers in the silicon wafer and data storage industries. Nanometrics standalone and integrated metrology systems measure various thin film properties, critical dimensions, overlay control and optical, electrical and material properties, including the structural composition of silicon, compound semiconductor and photovoltaic devices, during various steps of the manufacturing process. These systems enable device manufacturers to improve yields, increase productivity and lower their manufacturing costs. The company maintains its headquarters in Milpitas, California, with sales and service offices worldwide. Nanometrics is traded on NASDAQ Global Market under the symbol NANO.

For more information, please click here

Contacts:
Investor Relations:
Claire McAdams
Headgate Partners LLC
530-265-9899 tel
530-265-9699 fax


Company Contact:
Kevin Heidrich
Nanometrics
408-545-6000 tel
408-232-5910 fax

Copyright © Nanometrics Incorporated

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

Less is More: Novel Cellulose Structure Requires Fewer Enzymes to Process Biomass to Fuel June 19th, 2013

Sound waves precisely position nanowires June 19th, 2013

Scientists Use Nanotechnology to Increase Thermal Stability of Essential Oils June 19th, 2013

Production of Bioactive Material for Quick Treatment of Bone Damages June 19th, 2013

Thin films

3-D printing could lead to tiny medical implants, electronics, robots, more June 18th, 2013

Beneq’s comprehensive industrial Thin Film Coating Services shorten time to market June 18th, 2013

Filmmaking magic with polymers June 12th, 2013

Nanotechnology Market Outlook 2017 June 7th, 2013

Memory Technology

Imec showcases innovation in RRAM R&D at VLSI Technology Symposium June 14th, 2013

Data Highways for Quantum Information June 13th, 2013

Filmmaking magic with polymers June 12th, 2013

Leti Workshop on Innovative Memory Technologies to Include Samsung, Micron, SST-Microchip, Bosch, Altis Semiconductor and STMicroelectronics: June 27 Event to Explore Latest Results in Semiconductor Memory R&D June 5th, 2013

Announcements

Less is More: Novel Cellulose Structure Requires Fewer Enzymes to Process Biomass to Fuel June 19th, 2013

Sound waves precisely position nanowires June 19th, 2013

Scientists Use Nanotechnology to Increase Thermal Stability of Essential Oils June 19th, 2013

Production of Bioactive Material for Quick Treatment of Bone Damages June 19th, 2013

Tools

Beating the Diffraction Limit by 1000X – An introduction to nanoscale IR imaging on Bruker AFMs with applications in graphene June 19th, 2013

Nanometrics Announces Participation in 5th Annual CEO Investor Summit: Accredited Investor and Publishing Research Analyst Event to be Held Concurrently With SEMICON West and Intersolar 2013 in San Francisco June 19th, 2013

Beneq’s comprehensive industrial Thin Film Coating Services shorten time to market June 18th, 2013

Which qubit my dear? New method to distinguish between neighbouring quantum bits June 18th, 2013

Solar/Photovoltaic

Polymer-coated catalyst protects "artificial leaf" June 17th, 2013

Further research on effects of nanomaterials: BASF participates in BMBF research project on safety of nanomaterials: Results allow easier and faster evaluation of nanoparticle behavior June 12th, 2013

Graphene and semiconductor technology together: smaller, cheaper, better June 12th, 2013

Space Solar Power: Key to a Livable Planet Earth June 10th, 2013

NanoNews-Digest
The latest news from around the world, FREE







  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More












ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project








abbigliamento uomo
Computer Accessories
© Copyright 1999-2013 7th Wave, Inc. All Rights Reserved PRIVACY POLICY :: CONTACT US :: STATS :: SITE MAP :: ADVERTISE