Nanotechnology Now

Our NanoNews Digest Sponsors





Heifer International

Wikipedia Affiliate Button


android tablet pc

Home > Press > Thin Film Thickness Measurements of Sub-Micron Sampling Areas

QDI 2010 Film™ microspectrophotometer
QDI 2010 Film™ microspectrophotometer

Abstract:
CRAIC Technologies, the leading manufacturer of UV-visible-NIR microscopes and microspectrometers, is pleased to announce the QDI 2010 Film™ microspectrophotometer.

Thin Film Thickness Measurements of Sub-Micron Sampling Areas

San Dimas, CA | Posted on May 11th, 2009

The QDI 2010 Film™ instrument is designed to measure the thickness of thin films of sub-micron sampling areas rapidly and non-destructively. Able to analyze films of many materials on both transparent and opaque substrates, the QDI 2010 Film™ enables the user to determine thin film thickness on everything from semiconductors, MEMS devices, disk drives to flat panel displays. When combined with CRAIC Technologies proprietary contamination imaging capabilities, the QDI 2010 Film™ represents a major step forward in that it is designed specifically for industrial processes.

"Many of our customers want to measure the thickness of thin films of smaller and smaller sampling areas for rapid quality control of their products. The QDI 2010 Film™ microspectrophotometer was built in response to customer requests for a powerful, flexible film thickness tool that can measure sub-micron areas on both transparent and opaque substrates. The QDI 2010 Film™ meets those needs" says Dr. Paul Martin, President.

The complete QDI 2010 Film™ solution combines advanced microspectroscopy with sophisticated software to enable the user to measure film thickness by either transmission or reflectance of many types of materials and substrates. Due to the flexibility of the CRAIC Technologies design, sampling areas can range from over 100 microns across to less than a micron. Designed for the production environment, it incorporates a number of easily modified processing recipes, the ability to create new film recipes and sophisticated tools for analyzing data. The ability to directly image and analyze films with ultraviolet microscopy can also be added to this instrument.

For more information about QDI 2010 Film™ microspectrophotometer and its applications, visit www.microspectra.com.

####

About CRAIC Technologies
CRAIC Technologies, Inc. is a global technology leader focused microimaging and microspectroscopy in the ultraviolet, visible and near-infrared regions. CRAIC Technologies creates innovative solutions, with the very best in customer support, by listening to our customers and implementing solutions that integrate operational excellence and technology expertise. CRAIC Technologies provides solutions for customers in forensic sciences, health sciences, semiconductor, geology, nanotechnology and materials science markets whose applications demand accuracy, precision, speed and the best in customer support.

For more information, please click here

Contacts:
CRAIC Technologies, Inc.
www.microspectra.com

1-310-573-8180

Copyright © CRAIC Technologies

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

Scientists Capture Ultrafast Snapshots of Light-Driven Superconductivity: X-rays reveal how rapidly vanishing 'charge stripes' may be behind laser-induced high-temperature superconductivity April 16th, 2014

'Life Redesigned: The Emergence of Synthetic Biology' Lecture at Brookhaven Lab on Wednesday, April 30: Biomedical Engineer James Collins to Speak for BSA Distinguished Lecture Series April 16th, 2014

ECHA Planning Workshop on Regulatory Challenges in the Risk Assessment of Nanomaterials April 16th, 2014

Lumerical files a provisional patent that extends the standard eigenmode expansion propagation technique to better address waveguide component design. Lumerical’s EME propagation tool will address a wide set of waveguide applications in silicon photonics and integrated optics April 16th, 2014

Thin films

Industry Veteran Fergus Clarke Joins Picodeon as CEO: Appointment comes as Picodeon prepares for growth April 8th, 2014

Scalable CVD process for making 2-D molybdenum diselenide: Rice, NTU scientists unveil CVD production for coveted 2-D semiconductor April 8th, 2014

High-quality nanometric bilayers prepared by aqueous solutions March 26th, 2014

A new concept for manufacturing wrinkling patterns on hard-nano-film/soft-matter-substrate March 24th, 2014

Announcements

UT Arlington physicist creates new nanoparticle for cancer therapy April 16th, 2014

Relieving electric vehicle range anxiety with improved batteries: Lithium-sulfur batteries last longer with nanomaterial-packed cathode April 16th, 2014

Aerotech X-Y ball-screw stage for economical high performance Planar positioning April 16th, 2014

Energy Research Facility Construction Project at Brookhaven Lab Wins U.S. Energy Secretary's Achievement Award April 16th, 2014

Tools

Scientists Capture Ultrafast Snapshots of Light-Driven Superconductivity: X-rays reveal how rapidly vanishing 'charge stripes' may be behind laser-induced high-temperature superconductivity April 16th, 2014

Aerotech X-Y ball-screw stage for economical high performance Planar positioning April 16th, 2014

Malvern reports on the publication of the 1000th peer-reviewed paper to cite NanoSight’s Nanoparticle Tracking Analysis, NTA April 16th, 2014

JPK announces expansion of its global sales and service activities in China and USA April 15th, 2014

NanoNews-Digest
The latest news from around the world, FREE







  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More














ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







© Copyright 1999-2014 7th Wave, Inc. All Rights Reserved PRIVACY POLICY :: CONTACT US :: STATS :: SITE MAP :: ADVERTISE