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Asylum Research scientists will be presenting their recent work in Piezoresponse Force Microscopy (PFM) at the upcoming MRS Spring Meeting, Session JJ, in San Francisco, CA on April 15-17, 2009. Asylum's Dr. Roger Proksch will be co-instructor for a tutorial on April 15 on "Nanoscale Electromechanics and Piezoresponse Force Microscopy - Recent Advances and Applications to Ferroelectric and Biological Systems" with Drs. Alexei Gruverman (University of Nebraska-Lincoln) and William Brownell (Baylor College of Medicine). Dr. Proksch will also be presenting an invited paper entitled "Multifrequency Response and Dissipation Mapping in Active Materials" on April 16, followed by "Nanoindentation-based Piezoresponse Imaging and Strain-induced Modification of Ferroelectric Domains" presented by Dr. Alejandro Bonilla (with Keith Jones and Roger Proksch), also of Asylum Research. Session JJ is open to all MRS attendees and is chaired by Dr. Brownell, Dr. Sergei V. Kalinin (Oak Ridge National Laboratory), Dr. Anna N. Morozovska (National Academy of Sciences of Ukraine), and Dr. Nagarajan Valanoor (University of New South Wales). Advanced Piezoresponse Force Microscopy capabilities are offered on all Asylum Research AFMs, including the MFP-3D™ Series and the new Cypher™ AFM. A 24-page monograph on Piezoresponse Force Microscopy is available at no charge from Asylum Research and can be viewed at www.asylumresearch.com, see "Latest News."
About Asylum Research
Asylum Research is the technology leader for atomic force and scanning probe microscopy (AFM/SPM) for both materials and bioscience applications. Started by former employees of Digital Instruments in 1999, we are a company dedicated to innovative instrumentation for nanoscience and nanotechnology, with over 200 years combined AFM/SPM experience from our scientists, engineers and software developers. Our instruments are used for a variety of nanoscience applications in material science, physics, polymers, chemistry, biomaterials, and bioscience, including single molecule mechanical experiments on DNA, protein unfolding and polymer elasticity, as well as force measurements for biomaterials, chemical sensing, polymers, colloidal forces, adhesion, and more. Asylum’s product line offers advanced imaging and measurement capabilities for a wide range of samples, including Dual AC™ mode, iDrive,™ Q-control, electrical characterization (CAFM, KFM, EFM), high voltage piezoresponse force microscopy (PFM), magnetic force microscopy (MFM) with our unique variable field module, quantitative nanoindenting, and a wide range of environmental accessories and application-ready modules.
Asylum’s MFP-3D, set the standard for AFM technology, with unprecedented precision and flexibility. The MFP-3D is the first AFM with true independent piezo positioning in all three axes, combined with low noise closed-loop feedback sensor technology. The MFP-3D offers both top and bottom sample viewing for easy integration with most commercially-available inverted optical microscopes.
Asylum’s new Cypher AFM is the world’s first completely new small sample AFM/SPM in over a decade, and sets the new standard as the world’s highest resolution AFM. Cypher provides low-drift closed loop atomic resolution for the most accurate images and measurements possible today, rapid AC imaging with small cantilevers, Spot-On™ automated laser alignment for easy setup, integrated thermal, acoustic and vibration control, and broad support for all major AFM/SPM scanning modes and capabilities.
Ask us about our legendary product and applications support and our exclusive 6-month money-back satisfaction guarantee.
Asylum Research also distributes third party cantilevers from Olympus, Nanoworld/Nanosensors, and our own MFM tips. We also supply a variety of accessories for AFM/SPM. We are dedicated to providing the most technically advanced AFM for researchers who want to take their experiments to the next level.
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