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FEI extends SEM to applications that were previously impossible or impractical
FEI's new Magellan™ extreme high-resolution scanning electron microscope (XHR SEM) allows scientists and engineers to quickly see 3D surface images at many different angles and at resolutions below one nanometer (about the size of ten hydrogen atoms, side-by-side). Most importantly, the Magellan XHR SEM images samples at very low beam energies, avoiding distortions otherwise caused by the beam penetrating into the material below.
FEI delivers the most innovative solutions for imaging, characterization and prototyping at the nanoscale. The company's most advanced TEM, SEM, and DualBeam™ solutions were created specifically for materials science, life science, and mining. Please visit FEI at Pittcon 2009 in booth 1642 to learn more about the Magellan and other high-resolution microscopy techniques.
About FEI Company
FEI (Nasdaq: FEIC) is the world leader in pioneering technologies and applications that deliver imaging solutions for 3D characterization, analysis and modification/prototyping with resolutions down to the sub-Ångström level. Our customers, working in advanced research and manufacturing, are supported by field-experienced applications specialists. They have open access to FEI’s prestigious global user network so they can succeed in accelerating nanoscale discovery and contribute to better living through new product commercialization. FEI’s NanoPorts in North America, Europe and Asia provide centers of technical excellence where our world-class community of customers and specialists collaborate on the ongoing development of new ideas and innovative solutions. FEI has sales and service operations in more than 50 countries around the world.
The FEI logo is a trademark of FEI Company.
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