Nanotechnology Now - Press Release: "Research and Markets: Measurement Technology and Intelligent Instruments VIII

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Research and Markets (www.researchandmarkets.com/research/c611bc/measurement_techno) has announced the addition of the "Measurement Technology and Intelligent Instruments VIII" report to their offering.

Research and Markets: Measurement Technology and Intelligent Instruments VIII - Now Available

DUBLIN, Ireland | Posted on December 16th, 2008

Measurement, rigorously defined as 'ascertaining the size, amount or degree of a measurand by instrumental comparison with a standard unit or by indirect calculation based upon theory', is what makes science and technology different to imagination. Measurement is essential in industry, commerce and daily life. In the manufacturing industry in particular, measurement and instrumentation technology play increasingly important roles not only in the traditional field of manufacturing but also in the new fields of micro/nanotechnology and bioengineering.

This book presents recent advances in the use of measurement and instrumentation in the manufacturing industry. A wide range of topics are covered including: micro/nanometrology, precision measurements, online and in-process measurements, surface metrology, optical metrology and image processing, bio-measurement, sensor technology, intelligent measurement and instrumentation, uncertainty, traceability and calibration and signal-processing algorithms.

The 163 peer-reviewed papers in this book include contributions from all over the world, including Australia, Austria, China, Croatia, Egypt, France, Germany, Hungary, Japan, Mexico, Poland, the Republic of Korea, Russia, Singapore, Spain, Taiwan, Turkey, the UK, the USA and Vietnam.

This work certainly presents the most up-to-date information on the use of measurement technology and intelligent instrumentation in areas ranging from basic research to industrial manufacture.

Key Topics Covered:

* Preface
* Sponsors
* List of Reviews
* I. Micro/ Nano-Metrology
* II. Precision Measurement
* III. Online and In-Process Measurement
* IV. Surface Metrology
* V. Optical Metrology and Image Processing
* VI. Biomeasurement
* VII. Sensor Technology
* VIII. Intelligent Measurement and Instrumentation
* IX. Uncertainty, Traceability and Calibration
* X. Signal Processing and Algorithm
* Author Index
* Keyword