Nanotechnology Now

Our NanoNews Digest Sponsors
Heifer International



Home > Press > Nanometrics Announces Caliper InSight™ Overlay Metrology System

Abstract:
Nanometrics Incorporated (Nasdaq:NANO), a leading supplier of advanced process control metrology equipment, today announced the launch of its Caliper InSight, a turnkey, image-based overlay metrology solution for advanced high-volume IC manufacturing.

Nanometrics Announces Caliper InSight™ Overlay Metrology System

MILPITAS, CA | Posted on December 3rd, 2008

Following the success of the Caliper élan and Caliper Ultra systems supporting the 90nm, 65nm and 45nm technology nodes, the Caliper InSight takes the next step forward in platform and optical design to improve system precision and throughput for overlay metrology solutions down to the 32nm and 22nm technology nodes.

"With the launch of the Caliper InSight, we continue to strengthen and expand product offerings in our core markets," commented Tim Stultz, president and chief executive officer of Nanometrics. "By working closely with our customers, we are able to continue to deliver maximum value through innovative technology platforms and product performance which meets their technology needs and timelines. A major milestone for this product launch was the selection of the Insight by a key Asian customer, who has put the system into production for measurement of their most advanced DRAM and Flash devices."

"The Caliper InSight is the next offering in a series of products designed to complement Nanometrics' new Lynx™ cluster metrology platform," added David Doyle, director of Nanometrics' Standalone Business Unit. "Combining the InSight with an IMPULSE™ (OCD) module onto a Lynx platform, we offer our customers a more complete solution for advanced lithography process control, all within a single system having the lowest cost of ownership in the industry."

Caliper InSight, Lynx and IMPULSE are trademarks of Nanometrics Incorporated.

####

About Nanometrics Incorporated
Nanometrics is a leader in the design, manufacture and marketing of high-performance process control metrology systems used in semiconductor manufacturing. Nanometrics standalone and integrated metrology systems measure various thin film properties, critical dimensions, overlay control and optical, electrical and material properties, including the structural composition of silicon and compound semiconductor devices, during various steps of the manufacturing process. These systems enable semiconductor manufacturers to improve yields, increase productivity and lower their manufacturing costs. The Company maintains its headquarters in Milpitas, California, with sales and service offices worldwide. Nanometrics is traded on NASDAQ Global Market under the symbol NANO.

For more information, please click here

Contacts:
Nanometrics Incorporated
Kevin Heidrich
408-545-6000
408-232-5910 fax

Copyright © Business Wire 2008

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

Researchers develop artificial building blocks of life March 8th, 2024

How surface roughness influences the adhesion of soft materials: Research team discovers universal mechanism that leads to adhesion hysteresis in soft materials March 8th, 2024

Two-dimensional bimetallic selenium-containing metal-organic frameworks and their calcinated derivatives as electrocatalysts for overall water splitting March 8th, 2024

Curcumin nanoemulsion is tested for treatment of intestinal inflammation: A formulation developed by Brazilian researchers proved effective in tests involving mice March 8th, 2024

Chip Technology

New chip opens door to AI computing at light speed February 16th, 2024

HKUST researchers develop new integration technique for efficient coupling of III-V and silicon February 16th, 2024

Electrons screen against conductivity-killer in organic semiconductors: The discovery is the first step towards creating effective organic semiconductors, which use significantly less water and energy, and produce far less waste than their inorganic counterparts February 16th, 2024

NRL discovers two-dimensional waveguides February 16th, 2024

Announcements

What heat can tell us about battery chemistry: using the Peltier effect to study lithium-ion cells March 8th, 2024

Curcumin nanoemulsion is tested for treatment of intestinal inflammation: A formulation developed by Brazilian researchers proved effective in tests involving mice March 8th, 2024

The Access to Advanced Health Institute receives up to $12.7 million to develop novel nanoalum adjuvant formulation for better protection against tuberculosis and pandemic influenza March 8th, 2024

Nanoscale CL thermometry with lanthanide-doped heavy-metal oxide in TEM March 8th, 2024

Tools

First direct imaging of small noble gas clusters at room temperature: Novel opportunities in quantum technology and condensed matter physics opened by noble gas atoms confined between graphene layers January 12th, 2024

New laser setup probes metamaterial structures with ultrafast pulses: The technique could speed up the development of acoustic lenses, impact-resistant films, and other futuristic materials November 17th, 2023

Ferroelectrically modulate the Fermi level of graphene oxide to enhance SERS response November 3rd, 2023

The USTC realizes In situ electron paramagnetic resonance spectroscopy using single nanodiamond sensors November 3rd, 2023

NanoNews-Digest
The latest news from around the world, FREE




  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More











ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project