Nanotechnology Now

Our NanoNews Digest Sponsors





Heifer International

Wikipedia Affiliate Button


DHgate

Home > Press > Nanometrics Announces Caliper InSight™ Overlay Metrology System

Abstract:
Nanometrics Incorporated (Nasdaq:NANO), a leading supplier of advanced process control metrology equipment, today announced the launch of its Caliper InSight, a turnkey, image-based overlay metrology solution for advanced high-volume IC manufacturing.

Nanometrics Announces Caliper InSight™ Overlay Metrology System

MILPITAS, CA | Posted on December 3rd, 2008

Following the success of the Caliper élan and Caliper Ultra systems supporting the 90nm, 65nm and 45nm technology nodes, the Caliper InSight takes the next step forward in platform and optical design to improve system precision and throughput for overlay metrology solutions down to the 32nm and 22nm technology nodes.

"With the launch of the Caliper InSight, we continue to strengthen and expand product offerings in our core markets," commented Tim Stultz, president and chief executive officer of Nanometrics. "By working closely with our customers, we are able to continue to deliver maximum value through innovative technology platforms and product performance which meets their technology needs and timelines. A major milestone for this product launch was the selection of the Insight by a key Asian customer, who has put the system into production for measurement of their most advanced DRAM and Flash devices."

"The Caliper InSight is the next offering in a series of products designed to complement Nanometrics' new Lynx™ cluster metrology platform," added David Doyle, director of Nanometrics' Standalone Business Unit. "Combining the InSight with an IMPULSE™ (OCD) module onto a Lynx platform, we offer our customers a more complete solution for advanced lithography process control, all within a single system having the lowest cost of ownership in the industry."

Caliper InSight, Lynx and IMPULSE are trademarks of Nanometrics Incorporated.

####

About Nanometrics Incorporated
Nanometrics is a leader in the design, manufacture and marketing of high-performance process control metrology systems used in semiconductor manufacturing. Nanometrics standalone and integrated metrology systems measure various thin film properties, critical dimensions, overlay control and optical, electrical and material properties, including the structural composition of silicon and compound semiconductor devices, during various steps of the manufacturing process. These systems enable semiconductor manufacturers to improve yields, increase productivity and lower their manufacturing costs. The Company maintains its headquarters in Milpitas, California, with sales and service offices worldwide. Nanometrics is traded on NASDAQ Global Market under the symbol NANO.

For more information, please click here

Contacts:
Nanometrics Incorporated
Kevin Heidrich
408-545-6000
408-232-5910 fax

Copyright © Business Wire 2008

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

Seeing quantum motion August 30th, 2015

Artificial leaf harnesses sunlight for efficient fuel production August 30th, 2015

Researchers use DNA 'clews' to shuttle CRISPR-Cas9 gene-editing tool into cells August 30th, 2015

Draw out of the predicted interatomic force August 30th, 2015

Chip Technology

Nanometrics to Participate in the Citi 2015 Global Technology Conference August 26th, 2015

Kwansei Gakuin University in Hyogo, Japan, uses Raman microscopy to study crystallographic defects in silicon carbide wafers August 25th, 2015

A little light interaction leaves quantum physicists beaming August 25th, 2015

'Magic' sphere for information transfer: Professor at the Lomonosov Moscow State University made the «magic» sphere for information transfer August 24th, 2015

Announcements

Seeing quantum motion August 30th, 2015

Artificial leaf harnesses sunlight for efficient fuel production August 30th, 2015

Researchers use DNA 'clews' to shuttle CRISPR-Cas9 gene-editing tool into cells August 30th, 2015

Draw out of the predicted interatomic force August 30th, 2015

Tools

Nanolab Technologies LEAPS Forward with High-Performance Analysis Services to the World: Nanolab Orders Advanced Local Electrode Atom Probe (LEAP®) Microscope from CAMECA Unit of AMETEK Materials Analysis Division August 27th, 2015

Nanometrics to Participate in the Citi 2015 Global Technology Conference August 26th, 2015

50 Years of Scanning Electron Microscopy from ZEISS: ZEISS celebrates the birth of the first commercial scanning electron microscope in 1965 August 26th, 2015

Announcing Oxford Instruments and School of Physics signing a Memorandum of Understanding August 26th, 2015

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More











ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







Car Brands
Buy website traffic