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Ambios Technology Introduces New Q-View White Light Interferometer / SPMSANTA CRUZ, CA | Posted on October 21st, 2008
The Q-View Interferometric Module integrates seamlessly onto the Q-Scope SPM platform. Q-View uses optical profiler technology to render and measure a large area (500Ám) in a few seconds. Switch to SPM mode and characterize surface structures at the sub-angstrom level. Rick Olds, Sales and Marketing Manager of Ambios Technology, commented, "The synergy of combining SPM and Interferometer technology on a single platform will greatly enhance surface imaging and metrology for the community of SPM users."
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