Nanotechnology Now - Press Release: "Agilent Technologies to Work with Delft University of Technology on Large-Signal, Sub-mm-Wave Characterization Techniques"

Home > Press > Agilent Technologies to Work with Delft University of Technology on Large-Signal, Sub-mm-Wave Characterization Techniques

Abstract:
Agilent Technologies (NYSE:A) announced today that it will collaborate with the Delft University of Technology in the Netherlands to research large-signal and sub-mm-wave characterization techniques.

Agilent Technologies to Work with Delft University of Technology on Large-Signal, Sub-mm-Wave Characterization Techniques

SANTA CLARA, CA and DELFT, Netherlands | Posted on September 22nd, 2008

"Agilent has been one of our biggest and most reliable supporters for the past two decades," said Leo de Vreede, associate professor in the research school of the Delft Institute for Microsystems and Nanoelectronics (DIMES). "We share a common view on application-driven RF characterization tools and use Agilent's software tools and instrumentation extensively in our education and research programs."

With this new collaboration, enabled by the emerging SmartMix/MEMPHIS project, there has been a tremendous acceleration in research activities and capabilities at DIMES. This is evidenced by the creation of two complementary characterization facilities: the RF and the sub-mm-wave DIMES characterization laboratories. These new facilities will enable DIMES to continue to lead technological advancement of devices, components and circuits into the sub-mm-wave frequency range.

"Delft University's leadership in RF characterization techniques for high-performance RF and wireless applications has already received international recognition," said Roger Stancliff, chief technical officer, Components Test Division, Agilent Technologies. "DIMES's expertise enriches our work and we are able to give aspiring young scientists the opportunity to work with the latest equipment in RF/microwave from Agilent."

The Large-signal and Sub-mm-wave Characterization Techniques seminar agenda and registration information can be found at www.agilent.com/find/DIMES.

About the SmartMix/MEMPHIS project

MEMPHIS is a research initiative sponsored by the Dutch government via the SmartMix program which supports innovators to work together. SmartMix encourages economic, civil-societal and cultural innovation that will enable the Netherlands to excel nationally and internationally. The goal of the MEMPHIS project is research and development of an integrated technology platform (silicon logic, nanoelectronics and photonics) to provide a broad range of multifunction miniaturized devices that combine electronics and photonic.

About Delft University of Technology

Delft University of Technology (TU Delft) is widely recognized as one of the foremost research universities in Europe. Established in 1987, the DIMES research institute at TU Delft has matured into a large central facility that supports advanced research and education in nanoelectronics and microsystems, with an emphasis on RF/microwave, 3-D processing, sensors/MEMS and large-area electronics. The extensive high frequency characterization laboratories in DIMES are the result of numerous long-term projects sponsored by leading semiconductor manufacturers and foundries, including: Philips, NXP Semiconductors, TSMC, Infineon, Skyworks, Texas Instruments and IBM Microelectronics.

####

About Agilent Technologies Inc.
Agilent Technologies Inc. (NYSE: A) is the world’s premier measurement company and a technology leader in communications, electronics, life sciences and chemical analysis. The company’s 20,000 employees serve customers in more than 110 countries. Agilent had net revenues of $5.4 billion in fiscal 2007.

For more information, please click here

Contacts:
Agilent Technologies
Janet Smith
+1-970-679-5397

or
PGC Ltd., for Agilent
Phil Grace
+44 (0)7740 700756

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark: