Nanotechnology Now

Our NanoNews Digest Sponsors





Heifer International

Wikipedia Affiliate Button


android tablet pc

Home > News > Hitachi, University Prototypes Low-damage Electron Analysis Microscope

July 30th, 2008

Hitachi, University Prototypes Low-damage Electron Analysis Microscope

Abstract:
Hitachi Ltd and Hokkaido University prototyped an electron analysis microscope that produces an enlarged image by irradiating an electron beam from a scanning electron microscope (SEM) to a specimen and analyzing the diffraction pattern of the scattered light.

Because the output of the electron beam is as low as 30keV, light element materials such as carbon can be observed without damage to the specimen. Unlike existing microscopes, distortion from aberration is limited in the prototype, because it does not use imaging lens.

"The actual prototype of an analysis microscope without an imaging lens is the first in the world," said professor Kazutoshi Gohara of Hokkaido University Graduate School of Engineering. The nanotube specimen was observed at 0.34nm resolution, according to Gohara.

In general, a transmission electron microscope (TEM), in which parallel electron beams of approximately 100keV irradiate a specimen, is used for electron level observation. However in this method, because of the high energy, damages such as displacement of atoms could occur in the specimens, making long-time or repeated observation difficult. In addition, distortion and blur due to aberration of lens are likely to occur, because images are enlarged by a imaging lens.

Source:
techon.nikkeibp.co.jp

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

Imaging

EPFL Research on the use of AFM based nanoscale IR spectroscopy for the study of single amyloid molecules wins poster competition at Swiss Physics Society meeting July 22nd, 2014

News and information

Organometallics welcomes new editor-in-chief: Paul Chirik, Ph.D. July 22nd, 2014

The Hiden EQP Plasma Diagnostic with on-board MCA July 22nd, 2014

Iran to Hold 3rd Int'l Forum on Nanotechnology Economy July 22nd, 2014

Nanometrics Announces Upcoming Investor Events July 22nd, 2014

Announcements

Nanometrics Announces Upcoming Investor Events July 22nd, 2014

Bruker Awarded Fourth PeakForce Tapping Patent: AFM Mode Uniquely Combines Highest Resolution Imaging and Material Property Mapping July 22nd, 2014

NIST shows ultrasonically propelled nanorods spin dizzyingly fast July 22nd, 2014

Penn Study: Understanding Graphene’s Electrical Properties on an Atomic Level July 22nd, 2014

Tools

EPFL Research on the use of AFM based nanoscale IR spectroscopy for the study of single amyloid molecules wins poster competition at Swiss Physics Society meeting July 22nd, 2014

The Hiden EQP Plasma Diagnostic with on-board MCA July 22nd, 2014

Nanometrics Announces Upcoming Investor Events July 22nd, 2014

Bruker Awarded Fourth PeakForce Tapping Patent: AFM Mode Uniquely Combines Highest Resolution Imaging and Material Property Mapping July 22nd, 2014

Research partnerships

Penn Study: Understanding Graphene’s Electrical Properties on an Atomic Level July 22nd, 2014

More than glitter: Scientists explain how gold nanoparticles easily penetrate cells, making them useful for delivering drugs July 21st, 2014

Tiny laser sensor heightens bomb detection sensitivity July 19th, 2014

Labs characterize carbon for batteries: Rice, Lawrence Livermore scientists calculate materials’ potential for use as electrodes July 14th, 2014

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More














ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







© Copyright 1999-2014 7th Wave, Inc. All Rights Reserved PRIVACY POLICY :: CONTACT US :: STATS :: SITE MAP :: ADVERTISE