Nanotechnology Now

Our NanoNews Digest Sponsors

Heifer International

Wikipedia Affiliate Button

Home > Press > Trace Contaminant Detection by Ultraviolet Microscopy and Microspectroscopy

Abstract:
Organic and inorganic contaminants of precision devices such as flat panel displays, MEMS device and patterned semiconductors are often difficult to detect. Many contaminant materials are essentially invisible to common analytical techniques such as optical microscopy. CRAIC Technologies, Inc, a global leader in application-focused microanalysis solutions, provides the capability to both detect and analyze trace contaminants with a single instrument. This is done by combining both ultraviolet microscopy with ultraviolet microspectroscopy in the CRAIC Technologies QDI 2010™ microspectrophotometer equipped with the optional QDI ImageUV™ package.

Trace Contaminant Detection by Ultraviolet Microscopy and Microspectroscopy

San Dimas, CA | Posted on May 25th, 2008

Many organic and inorganic materials absorb light in the ultraviolet region but are invisible to the naked eye. This means that standard optical microscopy will not be able to detect these contaminants and has no other means of analyzing them. While other techniques are available, they require extensive sample preparation and can damage the sample. By utilizing ultraviolet micro-imaging, the user is able to quickly, easily and non-destructively locate many contaminants. UV microspectroscopy can then be performed to measure the electronic spectral characteristics of the contaminant in order to identify it. The spectra can also be used to further improve the clarity of the image of the contaminants by determining the wavelength of maximum absorbance. By combining both techniques in a single instrument, the QDI 2010™ microspectrophotometer, the user is easily able to locate and identify contaminant materials on flat panel displays, semiconductor chips, MEMS and even microfluidic devices. The QDI 2010™ microspectrophotometer is the first system ever to combine both UV microscopy and microspectroscopy in a single tool. It can also be upgraded to enable ultraviolet, visible and near infrared reflectance, transmittance and fluorescence microscopy and microspectroscopy.

####

About CRAIC Technologies, Inc.
CRAIC Technologies, Inc. is a global technology leader focused micro imaging and microspectroscopy in the ultraviolet, visible and near-infrared regions. CRAIC Technologies creates innovative solutions, with the very best in customer support, by listening to thier customers and implementing solutions that integrate operational excellence and technology expertise. CRAIC Technologies provides solutions for customers in forensic sciences, health sciences, semiconductor, geology, nanotechnology and materials science markets whose applications demand accuracy, precision, speed and the best in customer support.

For more information, please click here

Contacts:
CRAIC Technologies, Inc.
948 N. Amelia Ave.
San Dimas, CA 91773
USA
Toll Free: 877-UV-CRAIC (877-882-7242)
General: +001-310-573-8180
Fax: +001-310-573-8182
Information and Sales:

Copyright © CRAIC Technologies, Inc.

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

New nano approach could cut dose of leading HIV treatment in half February 24th, 2017

Atom-scale oxidation mechanism of nanoparticles helps develop anti-corrosion materials February 24th, 2017

Atomic force imaging used to study nematodes: KFU bionanotechnology lab (head - Dr. Rawil Fakhrullin) has obtained 3-D images of nematodes' cuticles February 23rd, 2017

Particle Works creates range of high performance quantum dots February 23rd, 2017

Imaging

Atomic force imaging used to study nematodes: KFU bionanotechnology lab (head - Dr. Rawil Fakhrullin) has obtained 3-D images of nematodes' cuticles February 23rd, 2017

JPK selects compact tensile stage from Deben for their NanoWizard® AFM platform to broaden capabilities for materials characterisation February 22nd, 2017

Announcements

New nano approach could cut dose of leading HIV treatment in half February 24th, 2017

Atom-scale oxidation mechanism of nanoparticles helps develop anti-corrosion materials February 24th, 2017

Atomic force imaging used to study nematodes: KFU bionanotechnology lab (head - Dr. Rawil Fakhrullin) has obtained 3-D images of nematodes' cuticles February 23rd, 2017

Particle Works creates range of high performance quantum dots February 23rd, 2017

Tools

Atomic force imaging used to study nematodes: KFU bionanotechnology lab (head - Dr. Rawil Fakhrullin) has obtained 3-D images of nematodes' cuticles February 23rd, 2017

JPK selects compact tensile stage from Deben for their NanoWizard® AFM platform to broaden capabilities for materials characterisation February 22nd, 2017

Molecular phenomenon discovered by advanced NMR facility: Cutting edge technology has shown a molecule self-assembling into different forms when passing between solution state to solid state, and back again - a curious phenomenon in science - says research by the University of Wa February 22nd, 2017

Strem Chemicals and Dotz Nano Ltd. Sign Distribution Agreement for Graphene Quantum Dots Collaboration February 21st, 2017

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More











ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project