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Home > Press > FEI Receives Award for Titan S/TEM at Nano Tech 2008 in Japan

Abstract:
Technology Award Recognizes Contributions to Nano Research

FEI Receives Award for Titan S/TEM at Nano Tech 2008 in Japan

PORTLAND, OR | Posted on March 19th, 2008

FEI Company (Nasdaq: FEIC) today announced that its Titan™ 80-300 S/TEM (scanning/transmission electron microscope), the world's most powerful commercially available microscope, was honored with the award for technical excellence in evaluation and measurement at Nano Tech 2008, February 13-15 in Tokyo, Japan. The award recognizes both innovative technology and the contributions the Titan S/TEM has enabled in nanotechnology research.

According to Professor Tomoji Kawai, chairman, Nano Tech Executive Committee, "FEI has been a major contributor to the science of nanotechnology since its inception. The introduction of aberration-corrected TEM is a major breakthrough that gives scientists the ability to directly visualize nanostructures with Sub-Ångström imaging resolution. A new model with high resolution EELS (electron energy loss spectroscopy) that can provide analytical results with the same high resolution has also been put into practical use."

"The Titan S/TEM's sub-Ångström resolution, along with its stability, reliability and ease of use, have helped scientists discover new relationships between structure and properties that are driving development at the nanoscale," said Koyo Iwasaki, FEI Japan's country director who accepted the award for FEI. "This award from one of the world's premier nanotechnology conferences highlights the significance of the Titan platform to nanoscience."

Unlike conventional S/TEMs, which require complex computational procedures to reconstruct high resolution images, the Titan S/TEM's aberration-corrected electron optics provides directly interpretable image resolution at the atomic scale. Its proven ability to deliver unparalleled results has made it the preferred S/TEM of leading researchers around the world. In addition to the Titan 80-300 platform, introduced in 2005, the Titan product family now also includes the Titan Krios™ platform for cryo-TEM, and the Titan3™ 80-300 S/TEM, which is environmentally hardened to reduce facility costs.

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About FEI Company
FEI (Nasdaq: FEIC) is the world leader in pioneering technologies and applications that deliver imaging solutions for 3D characterization, analysis and modification/prototyping with resolutions down to the sub-Ångström level. Our customers, working in advanced research and manufacturing, are supported by field-experienced applications specialists. They have open access to FEI’s prestigious global user network so they can succeed in accelerating nanoscale discovery and contribute to better living through new product commercialization. FEI’s NanoPorts in North America, Europe and Asia provide centers of technical excellence where our world-class community of customers and specialists collaborate on the ongoing development of new ideas and innovative solutions. FEI has sales and service operations in more than 50 countries around the world. More information can be found at: www.fei.com.

The FEI logo, Titan, Krios and Titan3 are trademarks of FEI Company.

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Contacts:
FEI Company
Corporate Communications
Dan Fineberg
+1 503-726-7698

or
Agency contact:
MindWrite Communications, Inc.
Principal
Sandy Fewkes
+1 408-224-4024

Copyright © FEI Company

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