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Home > Press > Veeco Hosts 6th Annual International Nanoscience Conference in Europe

Veeco Instruments Inc. (Nasdaq: VECO), a leading provider of instrumentation to the nanoscience community, announced that on-line registration and call for papers are now open for the "Seeing at the Nanoscale VI" conference to be held in Berlin, Germany at the Maritim proArte Hotel on July 9-11, 2008. Celebrating its sixth year, the conference provides an optimum setting for scientists to share information on a wide-variety of cutting-edge nanotechnology topics. The event is sponsored by Veeco Instruments and supported by the Department of Physics, Humboldt University Berlin.

Veeco Hosts 6th Annual International Nanoscience Conference in Europe

WOODBURY, NY | Posted on January 14th, 2008

"Seeing at the Nanoscale has become a prime international event featuring the latest advances in nanoscience with scanning probes and their strong impact on nanotechnologies," commented this year's conference chairman, Physics Professor Dr. Jürgen P. Rabe from Humboldt University Berlin. "This is a very exciting time in the nanosciences, and I am looking forward to the innovations and research that will be discussed this year. The last time the conference was held in Europe, it was an outstanding success, and I am delighted to welcome everyone to Berlin!"

The three-day conference, themed "Exploring the Future of Nanotechnology," provides both a platform and a tremendous opportunity for scientists worldwide to discuss their latest discoveries, and to share their research on next-generation nanotechnology with their peers and other visionaries in the field of nanoscience. Each year the conference hosts several hundred international researchers and scientists. Conference sessions for 2008 include:
Session I Extending the limits of SPM: high speed scanning, ultra high resolution imaging, multiple probe SPM, novel probes
Chair Georg Schitter, TU Delft, Delft, The Netherlands
Keynote Toshio Ando, Kanazawa University, Kanazawa, Japan
Invited Speaker Oscar Custance, National Institute for Materials Science (NIMS), Tsukuba, Japan
Session II From single biomolecules to cells: using AFM and combined AFM-optical
Chair Hans Oberleithner, Universität Münster, Münster, Germany
Keynote Daniel Müller, BIOTEC, Dresden, Germany
Invited Speaker Clive Roberts, Chair of Pharmaceutical Nanotechnology, School of Pharmacy and Director of the Nottingham Nanotechnology and Nanoscience Centre The University of Nottingham, United Kingdom
Session III Next generation materials and polymer systems
Chair G.J. Vancso, Universiteit Twente, Enschede, The Netherlands
Keynote Jiro Kumaki, Yashima Super-structured Helix Project, ERATO, JST, Nagoya, Japan
Invited Speaker Christian Fretigny, CNRS, Paris, France
Session IV Beyond topography: measurement of physical properties at the Nanoscale - nanomechanical, electrical, optical, magnetic and thermal
Chair Robert W. Stark, Ludwig-Maximilians-Universität München, Munich, Germany
Keynote Wilfried Vandervorst, IMEC, Leuven, Belgium and Dept. Physics, KULeuven, Belgium
Invited Speaker Ozgur Sahin, Harvard University, USA

Additional conference information, registration and abstract submission can be found at Don't miss out on one of the premier nanoscience events of 2008. Register today!


About Veeco Instruments Inc.
Veeco Instruments Inc. provides solutions for nanoscale applications in the worldwide data storage, semiconductor, HB-LED/wireless and scientific research markets. Our Metrology products are used to measure at the nanoscale and our Process Equipment tools help create nanoscale devices. Veeco's manufacturing and engineering facilities are located in New York, New Jersey, California, Colorado, Arizona and Minnesota. Global sales and service offices are located throughout the United States, Europe, Japan and Asia Pacific.

For more information, please click here

Veeco Instruments Inc.
Debra Wasser, 516-677-0200 x1472
SVP, Investor Relations & Corp. Communications
European Media:
Stephanie Pietri, 33 1 64 59 35 20
European Marketing Communication Manager
Metrology & Instrumentation:
Karen Gertz, 805-967-2700 x2412
Metrology Marketing Communications

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