Nanotechnology Now

Our NanoNews Digest Sponsors





Heifer International

Wikipedia Affiliate Button


android tablet pc

Home > Press > NIST Imaging System Maps Nanomechanical Properties

An atomic force microscope normally reveals the topography of a composite material (l.) NIST's new apparatus adds software and electronics to map nanomechanical properties (r.) The NIST system reveals that the glass fibers are stiffer than the surrounding polymer matrix but sometimes soften at their cores.

Credit: DC Hurley/NIST
An atomic force microscope normally reveals the topography of a composite material (l.) NIST's new apparatus adds software and electronics to map nanomechanical properties (r.) The NIST system reveals that the glass fibers are stiffer than the surrounding polymer matrix but sometimes soften at their cores.
Credit: DC Hurley/NIST

Abstract:
The National Institute of Standards and Technology (NIST) has developed an imaging system that quickly maps the mechanical properties of materials—how stiff or stretchy they are, for example—at scales on the order of billionths of a meter. The new tool can be a cost-effective way to design and characterize mixed nanoscale materials such as composites or thin-film structures.

NIST Imaging System Maps Nanomechanical Properties

GAITHERSBURG, MD | Posted on December 12th, 2007

The NIST nanomechanical mapper uses custom software and electronics to process data acquired by a conventional atomic force microscope (AFM), transforming the microscope's normal topographical maps of surfaces into precise two-dimensional representations of mechanical properties near the surface. The images enable scientists to see variations in elasticity, adhesion or friction, which may vary in different materials even after they are mixed together. The NIST system, described fully for the first time in a new paper,* can make an image in minutes whereas competing systems might take an entire day.

The images are based on measurements and interpretations of changes in frequency as a vibrating AFM tip scans a surface. Such measurements have commonly been made at stationary positions, but until now 2D imaging at many points across a sample has been too slow to be practical. The NIST DSP-RTS system (for digital signal processor-based resonance tracking system) has the special feature of locking onto and tracking changes in frequency as the tip moves over a surface. Mechanical properties of a sample are deduced from calculations based on measurements of the vibrational frequencies of the AFM tip in the air and changes in frequency when the tip contacts the material surface.

NIST materials researchers have used the system to map elastic properties of thin films with finer spatial resolution than is possible with other tools. The DSP-RTS can produce a 256 × 256 pixel image with micrometer-scale dimensions in 20 to 25 minutes. The new system also is modular and offers greater flexibility than competing approaches. Adding capability to map additional materials properties can be as simple as updating the software.

* A.B. Kos and D.C. Hurley. Nanomechanical mapping with resonance tracking scanned probe microscope. Measurement Science and Technology 19 (2008) 015504.

####

About NIST
From automated teller machines and atomic clocks to mammograms and semiconductors, innumerable products and services rely in some way on technology, measurement, and standards provided by the National Institute of Standards and Technology.

Founded in 1901, NIST is a non-regulatory federal agency within the U.S. Department of Commerce. NIST's mission is to promote U.S. innovation and industrial competitiveness by advancing measurement science, standards, and technology in ways that enhance economic security and improve our quality of life.

For more information, please click here

Contacts:
Laura Ost

(303) 497-4880

Copyright © NIST

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

Materials/Metamaterials

Penn Study: Understanding Graphene’s Electrical Properties on an Atomic Level July 22nd, 2014

NUS scientists use low cost technique to improve properties and functions of nanomaterials: By 'drawing' micropatterns on nanomaterials using a focused laser beam, scientists could modify properties of nanomaterials for effective applications in photonic and optoelectric applicat July 22nd, 2014

Steam from the sun: New spongelike structure converts solar energy into steam July 21st, 2014

Carbyne morphs when stretched: Rice University calculations show carbon-atom chain would go metal to semiconductor July 21st, 2014

Announcements

Harris & Harris Group to Host Conference Call on Second-Quarter 2014 Financial Results on August 15, 2014 July 23rd, 2014

UCF Nanotech Spinout Developing Revolutionary Battery Technology: Power the Next Generation of Electronics with Carbon July 23rd, 2014

Deadline Announced for Registration in 7th Int'l Nanotechnology Festival in Iran July 23rd, 2014

A Crystal Wedding in the Nanocosmos July 23rd, 2014

Tools

EPFL Research on the use of AFM based nanoscale IR spectroscopy for the study of single amyloid molecules wins poster competition at Swiss Physics Society meeting July 22nd, 2014

The Hiden EQP Plasma Diagnostic with on-board MCA July 22nd, 2014

Nanometrics Announces Upcoming Investor Events July 22nd, 2014

Bruker Awarded Fourth PeakForce Tapping Patent: AFM Mode Uniquely Combines Highest Resolution Imaging and Material Property Mapping July 22nd, 2014

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More














ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







© Copyright 1999-2014 7th Wave, Inc. All Rights Reserved PRIVACY POLICY :: CONTACT US :: STATS :: SITE MAP :: ADVERTISE