Nanotechnology Now







Heifer International

Wikipedia Affiliate Button


DHgate

Home > Press > NIST Imaging System Maps Nanomechanical Properties

An atomic force microscope normally reveals the topography of a composite material (l.) NIST's new apparatus adds software and electronics to map nanomechanical properties (r.) The NIST system reveals that the glass fibers are stiffer than the surrounding polymer matrix but sometimes soften at their cores.

Credit: DC Hurley/NIST
An atomic force microscope normally reveals the topography of a composite material (l.) NIST's new apparatus adds software and electronics to map nanomechanical properties (r.) The NIST system reveals that the glass fibers are stiffer than the surrounding polymer matrix but sometimes soften at their cores.
Credit: DC Hurley/NIST

Abstract:
The National Institute of Standards and Technology (NIST) has developed an imaging system that quickly maps the mechanical properties of materials—how stiff or stretchy they are, for example—at scales on the order of billionths of a meter. The new tool can be a cost-effective way to design and characterize mixed nanoscale materials such as composites or thin-film structures.

NIST Imaging System Maps Nanomechanical Properties

GAITHERSBURG, MD | Posted on December 12th, 2007

The NIST nanomechanical mapper uses custom software and electronics to process data acquired by a conventional atomic force microscope (AFM), transforming the microscope's normal topographical maps of surfaces into precise two-dimensional representations of mechanical properties near the surface. The images enable scientists to see variations in elasticity, adhesion or friction, which may vary in different materials even after they are mixed together. The NIST system, described fully for the first time in a new paper,* can make an image in minutes whereas competing systems might take an entire day.

The images are based on measurements and interpretations of changes in frequency as a vibrating AFM tip scans a surface. Such measurements have commonly been made at stationary positions, but until now 2D imaging at many points across a sample has been too slow to be practical. The NIST DSP-RTS system (for digital signal processor-based resonance tracking system) has the special feature of locking onto and tracking changes in frequency as the tip moves over a surface. Mechanical properties of a sample are deduced from calculations based on measurements of the vibrational frequencies of the AFM tip in the air and changes in frequency when the tip contacts the material surface.

NIST materials researchers have used the system to map elastic properties of thin films with finer spatial resolution than is possible with other tools. The DSP-RTS can produce a 256 × 256 pixel image with micrometer-scale dimensions in 20 to 25 minutes. The new system also is modular and offers greater flexibility than competing approaches. Adding capability to map additional materials properties can be as simple as updating the software.

* A.B. Kos and D.C. Hurley. Nanomechanical mapping with resonance tracking scanned probe microscope. Measurement Science and Technology 19 (2008) 015504.

####

About NIST
From automated teller machines and atomic clocks to mammograms and semiconductors, innumerable products and services rely in some way on technology, measurement, and standards provided by the National Institute of Standards and Technology.

Founded in 1901, NIST is a non-regulatory federal agency within the U.S. Department of Commerce. NIST's mission is to promote U.S. innovation and industrial competitiveness by advancing measurement science, standards, and technology in ways that enhance economic security and improve our quality of life.

For more information, please click here

Contacts:
Laura Ost

(303) 497-4880

Copyright © NIST

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

Materials/Metamaterials

The National Science Foundation names engineering researcher Andrea Alú its Alan T. Waterman awardee for 2015: Alú is a pioneer in the field of metamaterials who has developed "cloaking" technology to make objects invisible to sensors April 16th, 2015

Cobalt film a clean-fuel find: Rice University discovery is efficient, robust at drawing hydrogen and oxygen from water April 15th, 2015

Combined effort for structural determination April 15th, 2015

Harvesting energy from electromagnetic waves: In the future, clean alternatives such as harvesting energy from electromagnetic waves may help ease the world's energy shortage April 15th, 2015

Announcements

Protein Building Blocks for Nanosystems: Scientists develop method for producing bio-based materials with new properties April 17th, 2015

Oxford Instruments commissions high field outsert magnet system for the National High Magnetic Field Laboratory 32 Tesla magnet program April 17th, 2015

Newly-Developed Nanocatalysts Increase Performance of Fuel Cells April 16th, 2015

Lanthanide-Organic Framework Nanothermometers Prepared by Spray-Drying April 16th, 2015

Tools

Oxford Instruments commissions high field outsert magnet system for the National High Magnetic Field Laboratory 32 Tesla magnet program April 17th, 2015

Lanthanide-Organic Framework Nanothermometers Prepared by Spray-Drying April 16th, 2015

Combined effort for structural determination April 15th, 2015

JPK reports on the use of the NanoWizard® 3 AFM system at the Hebrew University of Jerusalem April 14th, 2015

NanoNews-Digest
The latest news from around the world, FREE




  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More










ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







© Copyright 1999-2015 7th Wave, Inc. All Rights Reserved PRIVACY POLICY :: CONTACT US :: STATS :: SITE MAP :: ADVERTISE