Nanotechnology Now

Our NanoNews Digest Sponsors



Heifer International

Wikipedia Affiliate Button


android tablet pc

Home > Press > Park Systems Signs Agreement with Seagate Technology to Develop and Supply Next-Generation AFMs

Park Systems XE-70 Atomic Force Microscope (Photo:Business Wire)
Park Systems XE-70 Atomic Force Microscope (Photo:Business Wire)

Abstract:
Park Systems Corp., a global provider of nanoscale measurement systems for research and industry, announced today that it has entered into a master development agreement to develop and supply next-generation Atomic Force Microscopes (AFM) to Seagate Technology (NYSE:STX), the worldwide leader in the design, manufacture and marketing of hard disc drives.

Park Systems Signs Agreement with Seagate Technology to Develop and Supply Next-Generation AFMs

SANTA CLARA, CA | Posted on November 10th, 2007

"As the density of hard disk storage increases, the design rules of hard drive sliders rapidly decreases," said Park Systems CEO Dr. Sang-il Park. "Atomic force microscopes must make reliable and repeatable PTR measurements of less than a tenth of a nanometer."

Dr. Park explained that traditional AFMs use piezoelectric tubes for X-Y-Z scanning. The X-Y motion relies on the bending of the tube, which causes Z position errors and introduces background curvatures. "Thus, it is fundamentally impossible for the previous generation of AFMs to provide the high level of metrology sought by storage manufacturers," he said.

To overcome these limitations, Park Systems developed the Cross-Talk Elimination (XE) AFM, featuring decoupled X-Y and Z scanners. Park's XE Series of AFMs minimize background curvature to one nanometer over 100 micrometers in-plane. There is no intrinsic bowing, even on the flattest sample. This ensures accurate images and enables observation of even the most subtle surface features, since no raw data correction needs to be applied. Park Systems will exhibit their new XE and NSOM systems in Booth 101 at the 2007 Fall Materials Research Society (MRS) Exhibition, November 27-29, Hynes Convention Center, Boston, Massachusetts.

Park Systems XE Series AFMs conduct measurements in true non-contact mode, preserving the sharpness of the tip and ensuring that nanoscale metrology can be conducted without corrupting the sample. Park Systems (formerly PSIA) began working with Seagate in 2004 and was awarded the master development agreement in 2006. Park Systems supplies Seagate with next-generation AFMs with full automation capabilities.

####

About Park Systems Corp.
Park Systems, one of the earliest manufacturers of AFMs, produces AFMs and SPMs for both small- and large-sample measurements, Near-field Scanning Optical Microscopy (NSOM), Raman Spectrometry, and for industrial applications, including hard disk inspection, next-generation sliders, sidewall/overhang imaging and profiling, and semiconductors.

For more information, please click here

Contacts:
For Park Systems Corp.
Sung Park, 408-986-1110

or
c3PR
Mar Junge, 408-730-8506

Copyright © Business Wire 2007

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

Announcements

Wear-resistant ceramic powder maximises component lifespan in high-stress applications: Innovnano’s nanostructured 3YSZ offers improved tribological performance for manufacturing components September 18th, 2014

IEEE International Electron Devices Meeting To Celebrate 60th Anniversary as The Leading Technical Conference for Advanced Semiconductor Devices September 18th, 2014

FEI Opens New Technology Center in Czech Republic: FEI expands its presence in Brno with the opening of a new, larger facility September 18th, 2014

Biosensors Get a Boost from Graphene Partnership: $5 Million Investment Supports Dozens of Jobs and Development of 300mm Fabrication Process and Wafer Transfer Facility September 18th, 2014

Tools

IEEE International Electron Devices Meeting To Celebrate 60th Anniversary as The Leading Technical Conference for Advanced Semiconductor Devices September 18th, 2014

FEI Opens New Technology Center in Czech Republic: FEI expands its presence in Brno with the opening of a new, larger facility September 18th, 2014

New NPZ100-403 Piezo Stage from nPoint Inc. September 17th, 2014

Researchers Create World’s Largest DNA Origami September 11th, 2014

New-Contracts/Sales/Customers

Fullerex: Talga Resources Joins INSCX™ Exchange September 4th, 2014

Global Energy Systems Signs Master Sales Agreement with China Aviation Supplies Group September 4th, 2014

East China University of Science and Technology Purchases Nanonex Advanced Nanoimprint Tool NX-B200 July 30th, 2014

University of Manchester selects Anasys AFM-IR for coatings and corrosion research July 30th, 2014

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More














ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







© Copyright 1999-2014 7th Wave, Inc. All Rights Reserved PRIVACY POLICY :: CONTACT US :: STATS :: SITE MAP :: ADVERTISE