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Nanometrics Incorporated (Nasdaq:NANO), a leading supplier of advanced metrology equipment to the semiconductor industry, today announced that AIXTRON AG, a leading provider of deposition tools used in the worldwide production of advanced components for electronic and opto-electronic applications, has purchased the Nanometrics VERTEX photoluminescence (PL) mapping system to determine material composition, measure layer thickness and improve the wafer uniformity Performance of its equipment.
AIXTRON manufactures metal organic chemical vapor deposition (MOCVD) equipment, a key processing tool used to produce high-brightness light-emitting diodes (HBLEDs). The Nanometrics VerteX is expected to be installed during the fourth quarter of 2007 at AIXTRON's Aachen, Germany demonstration facility.
"The VerteX system will be a tremendous asset to our demonstration facility," said Professor Dr. Michael Heuken, Vice President Corporate Research and Development at AIXTRON. "Not only will we be able to monitor the performance and accuracy of our equipment, but our customers will get quantifiable data from our tool as well. Our installation of the VerteX system will give our facility the most advanced production PL mapping capability on the market today, which is required to demonstrate the advantages of our recently-introduced reactors with larger production capacity."
AIXTRON will replace its current PL mapping tool, Nanometrics' RPM2000, with the VerteX in order to obtain greater execution for its deposition systems and processes.
"This purchase of our VerteX system marks another milestone in our long-term relationship with AIXTRON," said Tom Ryan, Nanometrics Business Unit Manager, Materials Characterization. "Our collaboration with a market leader such as AIXTRON will give us greater insight into current and Future technology, which will help in our commitment to the advancement of Nanometrics' PL mapping technology."
Nanometrics is a leader in the design, manufacture and marketing of high-performance process control metrology systems used in semiconductor manufacturing. Nanometrics standalone and integrated metrology systems measure various thin film properties, critical dimensions, overlay control and optical, electrical and material properties, including the structural composition of silicon and compound semiconductor devices, during various steps of the manufacturing process. These systems enable semiconductor manufacturers to improve yields, increase productivity and lower their manufacturing costs. The Company maintains its headquarters in Milpitas, California, with sales and service offices worldwide. Nanometrics is traded on NASDAQ Global Market under the symbol NANO. Nanometrics' website is http://www.nanometrics.com .
About AIXTRON AG
AIXTRON AG is a leading provider of deposition equipment to the semiconductor industry. The Company's technology solutions are used by a diverse range of customers worldwide to build advanced components for electronic and opto-electronic applications based on compound, silicon, or organic semiconductor materials. Such components are used in fiber optic communication systems, wireless and mobile telephony applications, optical and electronic storage devices, computing, signaling and lighting, as well as a range of other leading-edge technologies. AIXTRON AG's securities are listed on the Prime Standard market segment of the Frankfurt Stock Exchange and, as American Depositary Shares (ADS), on NASDAQ, and are included in the TecDax index, the NASDAQ Composite Index, the MSCI World Small Cap Index and the Nature Stock Index (NAI). Founded in 1983, the Company is headquartered in Aachen, Germany.
Forward Looking Statements
This press release contains forward-looking statements including, but not limited to, statements regarding the installation of a Nanometrics product at a customer site, the effect of that installation on the customer and Nanometrics and related matters. These statements relate to future events and involve known and unknown risks, uncertainties and other factors that may cause Nanometrics? actual results to differ materially from those expressed or implied by the forward-looking statements. Factors that could affect these forward-looking statements include the installation not taking place as anticipated and the potential that it will not have the expected impact. For additional information and considerations regarding the risks faced by Nanometrics, see its annual report on Form 10-K for the year ended December 30, 2006 as filed with the Securities and Exchange Commission, as well as other periodic reports filed with the SEC from time to time including its quarterly reports on Form 10-Q. Nanometrics disclaims any obligation to update information contained in any forward-looking statement.
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