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Home > Press > Cutting Edge Technical Programming Announced for Major UV & EB Event Including Green Chemistry and Sustainable Resources!

Abstract:
With technical sessions including:
Green Chemistry, Renewable Resources, Impact of REACH, Nanomaterials, Kinetics, Electronics Chemistry, Graphic Arts, Wood Coatings, High Performance Coatings and more, RadTech, the Association for Ultraviolet (UV) and Electron beam (EB) processes will feature the latest technical advancements in UV and EB curing technology at RadTech UV & > EB Technology Expo & Conference 2008, the world's largest UV and EB technology exposition and conference, May 4-7, 2008 at McCormick Place in Chicago, IL.

Cutting Edge Technical Programming Announced for Major UV & EB Event Including Green Chemistry and Sustainable Resources!

Chevy Chase, MD | Posted on November 5th, 2007

At RadTech UV & EB 2008, technologists from around the world will present over 200 papers detailing the science and application of UV and EB. In addition, a special full day will be devoted to technical developments in Japan and China with simultaneous translation--a special presentation on a lotus-effect dirt resistant coating is featured.

End user sessions for UV and EB curing include aerospace and defense, automotive OEM and refinish, sustainable packaging and printing, plastics, inkjet, metal finishing, and wood and building products.
RadTech is also offering a free online webinar Primer on UV & EB in March 2008, to introduce the technology to new and potential users.

####

About RadTech UV & EB 2008
Over 100 exhibitors with the latest equipment, raw materials and chemistry will be featured at the May event. For a complete list of all session descriptions and to register on-line please visit http://www.radtech2008.com . To request a complete RadTech UV & EB 2008 registration brochure by mail or to obtain information to exhibit call RadTech at (240) 497-1242 or email .

For more information, please click here

Contacts:
Mickey Fortune
240-643-0517

Copyright © RadTech UV & EB 2008

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