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August 5th, 2007
Jeol JXA-8500F is a unique type of electron microscope with analytical ability said to surpass that of even the most advanced scanning electron microscopes (SEM) available today.
Jeol USA has completed installation and acceptance of its first thermal field emission electron microprobe in the United States. The microprobe was installed at Nist in Gaithersburg, Maryland, in one of the world's most technically advanced laboratories for developing new technologies and standards for a wide range of nanotechnology fields.
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