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Home > News > Deal targets characterisation of novel materials

July 17th, 2007

Deal targets characterisation of novel materials

Abstract:
Keithley and CEA Leti will research methods for characterising advanced semiconductor materials and devices that support DC, high frequency and RF-level signals

Keithley Instruments has entered into a joint development partnership on semiconductor device material testing technology with CEA Leti, one of the world's most sophisticated semiconductor development laboratories. The deal calls for Keithley and CEA Leti to research methods for characterising advanced semiconductor materials and devices that support DC, high frequency and RF-level signals on both micro- and nano-level structures.

Source:
electronicstalk.com

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