Nanotechnology Now

Our NanoNews Digest Sponsors





Heifer International

Wikipedia Affiliate Button


android tablet pc

Home > Press > FEI introduces Vitrobot Mark IV

Abstract:
Next Generation Cryo Sample Prep Tool Offers New Levels of Automation and Ease of Use

FEI introduces Vitrobot Mark IV

HILLSBORO, OR | Posted on July 12th, 2007

has introduced the next generation of its popular Vitrobot™ cryo sample preparation tool, the Vitrobot Mark IV. The Mark IV is an easy-to-use system that features a newly-designed touchscreen user interface operated under a Linux operating system and robotics that ensures high-quality, reproducible freezing of samples. Automated transfer from the vitrification medium into the liquid nitrogen atmosphere offers more consistent and higher yield sample throughput.

Three-dimensional transmission electron microscopy (TEM) visualization of macromolecular structures and molecular machines in their native hydrated state has become a critical tool for structural biologists focusing on interactive biological and biochemical processes at the macromolecular level. The Vitrobot is a high-throughput tool designed to enable the physical fixation of biological structures within ultra-thin vitrified ice layers so samples can withstand the high voltages used in TEMs long enough to acquire the necessary image.

Beyond biological applications, the Vitrobot Mark IV can also be used for pharmaceutical, food and a variety of general industrial applications where colloidal structures need to be characterized and analyzed.

FEI will feature the Vitrobot Mark IV at the 26th Annual Meeting of the American Society for Virology, July 15-17, 2007 at Oregon State University in Corvallis, Ore. and at the Microscopy and Microanalysis meeting August 6-9, 2007 in Fort Lauderdale, Fla. (Booth 414). More about the Vitrobot can be discovered at http://www.fei.com/vitrobot .

####

About FEI Company
FEI (Nasdaq: FEIC) is a global leader in providing innovative instruments for nanoscale imaging, analysis and prototyping. FEI focuses on delivering solutions that provide groundbreaking results and accelerate research, development and manufacturing cycles for its customers in Semiconductor and Data Storage, Academic and Industrial R&D, and Life Sciences markets. With R&D centers in North America and Europe, and sales and service operations in more than 50 countries around the world, FEI’s Tools for Nanotech™ are bringing the nanoscale within the grasp of leading researchers and manufacturers. More information can be found online at http://www.fei.com .

This news release contains forward-looking statements about a new cryo sample preparation product and its capabilities. Factors that could affect these forward-looking statements include but are not limited to delays in the roll-out of the product, manufacturing or delivery delays, failure of suppliers to deliver products on time and to specification, and failure of the product to perform as expected due to technical or other reasons. Please also refer to our Form 10-K, Forms 10-Q, Forms 8-K and other filings with the U.S. Securities and Exchange Commission for additional information on these factors and other factors that could cause actual results to differ materially from the forward-looking statements. FEI assumes no duty to update forward-looking statements.

For more information, please click here

Contacts:
Dan Zenka, APR
Global Public Relations
FEI Company
+1 503 726 2695

Copyright © FEI Company

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

Announcements

Nanometrics Announces Upcoming Investor Events July 22nd, 2014

Bruker Awarded Fourth PeakForce Tapping Patent: AFM Mode Uniquely Combines Highest Resolution Imaging and Material Property Mapping July 22nd, 2014

NIST shows ultrasonically propelled nanorods spin dizzyingly fast July 22nd, 2014

Penn Study: Understanding Graphene’s Electrical Properties on an Atomic Level July 22nd, 2014

Tools

EPFL Research on the use of AFM based nanoscale IR spectroscopy for the study of single amyloid molecules wins poster competition at Swiss Physics Society meeting July 22nd, 2014

The Hiden EQP Plasma Diagnostic with on-board MCA July 22nd, 2014

Nanometrics Announces Upcoming Investor Events July 22nd, 2014

Bruker Awarded Fourth PeakForce Tapping Patent: AFM Mode Uniquely Combines Highest Resolution Imaging and Material Property Mapping July 22nd, 2014

Events/Classes

EPFL Research on the use of AFM based nanoscale IR spectroscopy for the study of single amyloid molecules wins poster competition at Swiss Physics Society meeting July 22nd, 2014

Iran to Hold 3rd Int'l Forum on Nanotechnology Economy July 22nd, 2014

Nanometrics Announces Upcoming Investor Events July 22nd, 2014

Iran to Host 1st Asian Congress on Nanostructures on Kish Island July 21st, 2014

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More














ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







© Copyright 1999-2014 7th Wave, Inc. All Rights Reserved PRIVACY POLICY :: CONTACT US :: STATS :: SITE MAP :: ADVERTISE