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Montfort-le-Gesnois, the 18th of June 2007. In the framework of its total quality policy, NANOLANE ( http://www.nano-lane.com ) has joined the X457 commission working on the first ISO and CEN standards in the Nanotechnology area. This commission is the French structure, mirror of the nanotechnology technical committee (TC 229) of the International Standardization Organization (ISO).
This structure leaded by the Agence Francaise de NORmalisation ( http://www.afnor.com ) is divided into four workgroups:
WG1 : Terminology, classification and nomenclature
WG2 : Measurement and characterization
WG3 : Health, safety and environmental issues
WG4 : Nanotechnology products and processes (only CEN)
Nanolane will be more particularly active in the WG2 ŒMeasurement and Characterization‚ headed by the Laboratoire Nationale de Métrologie et d‚Essais ( http://www.lne.fr ). By joining the X457 commission, Nanolane wishes to contribute in the needs for clearness and references in the nanometrology field and chooses to develop its products in accordance with future ISO and CEN standards.
The release of these ISO/CEN standards is planned for mid 2009.
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