Nanotechnology Now

Our NanoNews Digest Sponsors

Heifer International

Wikipedia Affiliate Button

Home > News > 25 years of scanning probe microscopy and no standards yet

May 25th, 2007

25 years of scanning probe microscopy and no standards yet

Abstract:
It has been 25 years since the scanning tunneling microscope (STM) was invented, followed four years later by the atomic force microscope, and that's when nanoscience and nanotechnology really started to take off. Various forms of scanning probe microscopes based on these discoveries are essential for many areas of today's research. Scanning probe techniques have become the workhorse of nanoscience and nanotechnology research. Given the 25-year development timeframe, it is surprising that even today there is no generally accepted standard for scanning probe microscopy (SPM). There is no unified SPM terminology, nor is there a standard for data management and treatment, making access and processing of SPM data collected by different types of instruments an error-prone exercise. SPM standardization has only recently begun as part of an effort by the International Organization for Standardization (ISO) the largest developer of industrial standards. Meanwhile the development of SPM instruments and analysis software continues, increasing the already large family of scanning probe microscopy.

Source:
nanowerk.com

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

Interviews/Book Reviews/Essays/Reports/Podcasts/Journals/White papers

Nanosensors could help determine tumors’ ability to remodel tissue: Measuring enzyme levels could help doctors select appropriate treatments September 29th, 2016

Fighting cancer with sticky nanoparticles September 27th, 2016

Gold nanoparticles conjugated quercetin inhibits epithelial-mesenchymal transition, angiogenesis and invasiveness via EGFR/VEGFR-2 mediated pathway in breast cancer September 27th, 2016

Crystalline Fault Lines Provide Pathway for Solar Cell Current: New tomographic AFM imaging technique reveals that microstructural defects, generally thought to be detrimental, actually improve conductivity in cadmium telluride solar cells September 26th, 2016

Tools

Oxford Instruments systems now facilitate water purification technology September 27th, 2016

Dr Barbara Armbruster promoted to Worldwide Sales and Marketing Director for XEI Scientific September 27th, 2016

Oxford Instruments is ‘Bringing the Nanoworld Together’ in India once again - 22 - 23 November 2016 | IISc Bangalore September 21st, 2016

Bruker Introduces Complete Commercial AFM-Based SECM Solution: PeakForce SECM Mode Enables Previously Unobtainable Electrochemical Information September 20th, 2016

NanoNews-Digest
The latest news from around the world, FREE




  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More











ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







Car Brands
Buy website traffic