Nanotechnology Now

Our NanoNews Digest Sponsors





Heifer International

Wikipedia Affiliate Button


DHgate

Home > News > 25 years of scanning probe microscopy and no standards yet

May 25th, 2007

25 years of scanning probe microscopy and no standards yet

Abstract:
It has been 25 years since the scanning tunneling microscope (STM) was invented, followed four years later by the atomic force microscope, and that's when nanoscience and nanotechnology really started to take off. Various forms of scanning probe microscopes based on these discoveries are essential for many areas of today's research. Scanning probe techniques have become the workhorse of nanoscience and nanotechnology research. Given the 25-year development timeframe, it is surprising that even today there is no generally accepted standard for scanning probe microscopy (SPM). There is no unified SPM terminology, nor is there a standard for data management and treatment, making access and processing of SPM data collected by different types of instruments an error-prone exercise. SPM standardization has only recently begun as part of an effort by the International Organization for Standardization (ISO) the largest developer of industrial standards. Meanwhile the development of SPM instruments and analysis software continues, increasing the already large family of scanning probe microscopy.

Source:
nanowerk.com

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

Interviews/Book Reviews/Essays/Reports/Podcasts/Journals/White papers

CWRU researchers efficiently charge a lithium-ion battery with solar cell: Coupling with perovskite solar cell holds potential for cleaner cars and more August 27th, 2015

Successful boron-doping of graphene nanoribbon August 27th, 2015

These microscopic fish are 3-D-printed to do more than swim: Researchers demonstrate a novel method to build microscopic robots with complex shapes and functionalities August 26th, 2015

Researchers combine disciplines, computational programs to determine atomic structure August 26th, 2015

Tools

Nanolab Technologies LEAPS Forward with High-Performance Analysis Services to the World: Nanolab Orders Advanced Local Electrode Atom Probe (LEAP®) Microscope from CAMECA Unit of AMETEK Materials Analysis Division August 27th, 2015

Nanometrics to Participate in the Citi 2015 Global Technology Conference August 26th, 2015

50 Years of Scanning Electron Microscopy from ZEISS: ZEISS celebrates the birth of the first commercial scanning electron microscope in 1965 August 26th, 2015

Announcing Oxford Instruments and School of Physics signing a Memorandum of Understanding August 26th, 2015

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More











ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







Car Brands
Buy website traffic