Home > News > Carl Zeiss SMT and SIINT open Nanotechnology Demonstration Center in Japan
April 27th, 2007
Carl Zeiss SMT and SIINT open Nanotechnology Demonstration Center in Japan
Abstract:
Carl Zeiss SMT and SII NanoTechnology (SIINT), a subsidiary of Seiko Instruments Inc., have opened their joint Yokohama Nanotechnology Demonstration Center as part of the global strategic alliance of Carl Zeiss SMT and SIINT announced in March 2006.
The Demonstration Center includes the electron and ion beam products of both companies, namely Scanning Electron Microscopes (SEM), Focused Ion Beam systems (FIB), FIB-SEM Hybrid Systems as well as Transmission Electron Microscopes (TEM).
Source:
fabtech.org
Bookmark:
| Related News Press |
Announcements
Oxford Instruments systems now facilitate water purification technology September 27th, 2016
Dr Barbara Armbruster promoted to Worldwide Sales and Marketing Director for XEI Scientific September 27th, 2016
Fighting cancer with sticky nanoparticles September 27th, 2016
Gold nanoparticles conjugated quercetin inhibits epithelial-mesenchymal transition, angiogenesis and invasiveness via EGFR/VEGFR-2 mediated pathway in breast cancer September 27th, 2016
Tools
Oxford Instruments systems now facilitate water purification technology September 27th, 2016
Dr Barbara Armbruster promoted to Worldwide Sales and Marketing Director for XEI Scientific September 27th, 2016
Oxford Instruments is ‘Bringing the Nanoworld Together’ in India once again - 22 - 23 November 2016 | IISc Bangalore September 21st, 2016
Bruker Introduces Complete Commercial AFM-Based SECM Solution: PeakForce SECM Mode Enables Previously Unobtainable Electrochemical Information September 20th, 2016
 |
||
 |
||
| The latest news from around the world, FREE | ||
 |
||
|
|
||
| Premium Products | ||
 |
||
|
Only the news you want to read!
Learn More |
||
 |
||
|
University Technology Transfer & Patents
Learn More |
||
 |
||
|
Full-service, expert consulting
Learn More |
||
|
|
||
