Home > News > Carl Zeiss SMT and SIINT open Nanotechnology Demonstration Center in Japan
April 27th, 2007
Carl Zeiss SMT and SIINT open Nanotechnology Demonstration Center in Japan
Abstract:
Carl Zeiss SMT and SII NanoTechnology (SIINT), a subsidiary of Seiko Instruments Inc., have opened their joint Yokohama Nanotechnology Demonstration Center as part of the global strategic alliance of Carl Zeiss SMT and SIINT announced in March 2006.
The Demonstration Center includes the electron and ion beam products of both companies, namely Scanning Electron Microscopes (SEM), Focused Ion Beam systems (FIB), FIB-SEM Hybrid Systems as well as Transmission Electron Microscopes (TEM).
Source:
fabtech.org
Bookmark:
| Related News Press |
Announcements
Organic solar cells reach record efficiency, benchmark for commercialization April 23rd, 2018
Remote-control shoots laser at nano-gold to turn on cancer-killing immune cells April 20th, 2018
New qubit now works without breaks: A universal design for superconducting qubits has been created April 19th, 2018
Observing biological nanotransporters: Chemistry April 19th, 2018
Tools
Observing biological nanotransporters: Chemistry April 19th, 2018
Individual impurity atoms detectable in graphene April 18th, 2018
 |
||
 |
||
| The latest news from around the world, FREE | ||
 |
||
|
|
||
| Premium Products | ||
 |
||
|
Only the news you want to read!
Learn More |
||
 |
||
|
Full-service, expert consulting
Learn More |
||
|
|
||