- About Us
- Career Center
- Nano-Social Network
- Nano Consulting
- My Account
April 27th, 2007
Carl Zeiss SMT and SII NanoTechnology (SIINT), a subsidiary of Seiko Instruments Inc., have opened their joint Yokohama Nanotechnology Demonstration Center as part of the global strategic alliance of Carl Zeiss SMT and SIINT announced in March 2006.
The Demonstration Center includes the electron and ion beam products of both companies, namely Scanning Electron Microscopes (SEM), Focused Ion Beam systems (FIB), FIB-SEM Hybrid Systems as well as Transmission Electron Microscopes (TEM).
|Related News Press|
Lithium battery catalyst found to harm key soil microorganism February 7th, 2016
Discovery of the specific properties of graphite-based carbon materials February 6th, 2016
Organic crystals allow creating flexible electronic devices: The researchers from the Faculty of Physics of the Moscow State University have grown organic crystals that allow creating flexible electronic devices February 5th, 2016
Cornell researchers create first self-assembled superconductor February 1st, 2016
New record in nanoelectronics at ultralow temperatures January 28th, 2016
LC.300 Series Nanopositioning Controller from nPoint January 28th, 2016