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April 27th, 2007
Carl Zeiss SMT and SII NanoTechnology (SIINT), a subsidiary of Seiko Instruments Inc., have opened their joint Yokohama Nanotechnology Demonstration Center as part of the global strategic alliance of Carl Zeiss SMT and SIINT announced in March 2006.
The Demonstration Center includes the electron and ion beam products of both companies, namely Scanning Electron Microscopes (SEM), Focused Ion Beam systems (FIB), FIB-SEM Hybrid Systems as well as Transmission Electron Microscopes (TEM).
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