Home > News > X-Tek announces new features for the Revolution X-ray inspection system
April 24th, 2007
X-Tek announces new features for the Revolution X-ray inspection system
The X-Tek Group announces the inclusion of a new camera and detector combination for the Revolution NanoTech X-ray inspection system at the Nepcon Shanghai Show.
X-Tek's cutting edge Revolution system will be exhibited at the X-Tek stand (4D03), where visitors will be able to experience the advanced 3D imaging capability of Computerized Tomography (C.T.).
Impix, the new scientific grade camera and detector combination, further improves the dynamic range, accuracy, repeatability and feature recognition capability of the Revolution. The camera boasts real-time frame rates at full camera resolution and full dynamic range. Using the X-Tek Inspect-X image enhancement software the X-ray image is displayed on a separate LCD monitor for clutter free viewing.
Ultracold atom waves may shed light on rogue ocean killers: Rice quantum experiments probe underlying physics of rogue ocean waves April 27th, 2017
Looking for the quantum frontier: Beyond classical computing without fault-tolerance? April 27th, 2017
Metal nanoparticles induced visible-light photocatalysis: Mechanisms, applications, ways of promoting catalytic activity and outlook April 27th, 2017
Arrowhead Pharmaceuticals to Webcast Fiscal 2017 Second Quarter Results April 27th, 2017
New Product Nanoparticle preparation from Intertronics with new Thinky NP-100 Nano Pulveriser April 26th, 2017
Affordable STM32 Cloud-Connectable Kit from STMicroelectronics Puts More Features On-Board for Fast and Flexible IoT-Device Development April 26th, 2017
Geoffrey Beach: Drawn to explore magnetism: Materials researcher is working on the magnetic memory of the future April 25th, 2017
NanoMONITOR shares its latest developments concerning the NanoMONITOR Software and the Monitoring stations April 21st, 2017