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April 24th, 2007
X-Tek announces new features for the Revolution X-ray inspection system
The X-Tek Group announces the inclusion of a new camera and detector combination for the Revolution NanoTech X-ray inspection system at the Nepcon Shanghai Show.
X-Tek's cutting edge Revolution system will be exhibited at the X-Tek stand (4D03), where visitors will be able to experience the advanced 3D imaging capability of Computerized Tomography (C.T.).
Impix, the new scientific grade camera and detector combination, further improves the dynamic range, accuracy, repeatability and feature recognition capability of the Revolution. The camera boasts real-time frame rates at full camera resolution and full dynamic range. Using the X-Tek Inspect-X image enhancement software the X-ray image is displayed on a separate LCD monitor for clutter free viewing.
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