Nanotechnology Now - Press Release: Metryx Expands Global Infrastructure to Meet Growing Demand for Mass Metrology

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Abstract:
Metryx, Limited, a supplier of mass metrology equipment to the semiconductor manufacturing industry, today announced the hiring of two new directors of business development. Mark Berry has been appointed North America and Europe Business Director while Gary Ditmer has joined Metryx as Asia Business Director in a move to support the company's increasing global business development activities. In addition, Liam Cunnane, previously North American Director of Technology, has been promoted to Worldwide Technology Director.

Metryx Expands Global Infrastructure to Meet Growing Demand for Mass Metrology

BRISTOL, England | Posted on April 10th, 2007

"We are at a stage now where we need to ramp up our internal capability in order to meet the growing acceptance of our mass metrology technology," stated Adrian Kiermasz, CEO of Metryx, Ltd. "Both Mark and Gary represent a significant win for us. We have been able to recruit two excellent employees who have extensive experience in the semiconductor industry. As we grow, both of their roles will be critical to the company, helping to increase our installed base and concurrently develop our service capability on a global level."

Mark Berry joined Metryx in April 2007, joining the company from Veeco where he held positions of increasing responsibility throughout his tenure, including Vice President of Sales for Veeco's compound semiconductor division. Prior to his time at Veeco, Berry also held sales and market development positions with Oxford Instruments Plasma Technology.

Gary Ditmer joined the company in January 2007. Based in Japan, Ditmer has extensive business experience in the Far East and has held key sales positions with Oxford Instruments Plasma Technology and Applied Materials. Ditmer holds a B.S. in chemical engineering from the Massachusetts Institute of Technology.

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About Metryx
Metryx is a semiconductor equipment manufacturer specializing in unique nanotechnology mass measurement techniques. Based in Bristol, England, Metryx’s non-destructive 200mm and 300mm metrology tools offer atomic layer accuracy making them ideal for material characterization and device manufacture process control.

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Contacts:
Metryx, Limited
Adrian Kiermasz, +44 (0)127 586-6260

or
Impress Public Relations
Dave Richardson, 415-994-1423

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