Home > Press > FEI and JKTech Team to Increase Efficiency of Mining Operations
Powerful Microscope and Software Combination Delivers Rapid Automated Analysis for Minerals Exploration and Processing
FEI and JKTech Team to Increase Efficiency of Mining Operations
HILLSBORO, OR | Posted on March 26th, 2007
FEI Company(Nasdaq: FEIC) and Australian-based JKTech have teamed to combine their innovative software and scanning electron microscope (SEM) technologies, delivering innovative applications that greatly enhance minerals processing and improve evaluation of exploration targets for mining operations. The combined solution features FEI's Quanta(TM) SEM and JKTech's Mineral Liberation Analyzer software and is available now with liquid-nitrogen-free, high throughput silicon drift EDS technology.
The Mineral Liberation Analyzer (MLA), capable of analyzing up to 16
different samples overnight without the need of an operator, is a high-
throughput and highly-automated mineral analysis system. It rapidly
identifies minerals in polished sections of drill core, particulate or lump
materials and quantifies a wide range of mineral characteristics such as
abundance, grain size and liberation distributions. The automated stage
control and image acquisition of the Quanta SEM enable imaging and
subsequent x-ray analysis of at least 5,000 individual particles for
concentrated samples and 50,000 or more particles for tailings or low-grade
materials. The geometallurgical and ore characterization data enables users
to optimize plant feed quality by avoiding metallurgically poor ore stocks
or facilitating effective ore blending.
"There are hundreds of mining operations around the world and all of
them are continually looking for means of increasing yields and lowering
cost," comments Dr. Geoff Gault, JKTech's managing director. "Because the
Mineral Liberation Analyzer not only delivers critical data for making
mineral processing more efficient, but also provides a highly effective
tool for evaluating exploration targets, this solution represents a
compelling value proposition for customers."
There are already more than a dozen leading international resource
companies on four continents utilizing the MLA package to improve
processing efficiencies for copper, nickel, lead, zinc, manganese, iron
ore, mineral sands and precious metals such as platinum, palladium, silver
and gold. Several are utilizing multiple tools for 24/7 analysis.
Universities and geological institutions are also finding the MLA a
valuable tool that contributes significantly to their research outcomes.
"The MLA package represents a complete mineral analysis solution that
can be tailored to suit high-throughput production applications and
research applications," said Bruno Janssens, vice president of FEI's
NanoResearch and Industry division. "Our customers are seeing a rapid
return on the investment from the MLA system founded upon the complementary
combined expertise and support of FEI and JKTech."
About FEI Company
FEI is a global leader in providing innovative instruments for
nanoscale imaging, analysis and prototyping. FEI focuses on delivering
solutions that provide groundbreaking results and accelerate research,
development and manufacturing cycles for its customers in Semiconductor and
Data Storage, Academic and Industrial R&D, and Life Sciences markets. With
R&D centers in North America and Europe, and sales and service operations
in more than 50 countries around the world, FEI's Tools for Nanotech(TM)
are bringing the nanoscale within the grasp of leading researchers and
manufacturers. More information can be found online at: http://www.fei.com .
JKTech Pty. Ltd. is the technology transfer company for the Julius
Kruttschnitt Mineral Research Centre (JKMRC) at the University of
Queensland in Brisbane, Australia. Its role is to take viable research
outcomes and transfer them to the international minerals industry. JKTech
offers a range of innovative solutions for the minerals industry aimed at
increasing productivity and metal recovery. These specialist products and
services include consulting, automated quantitative mineralogy, specialist
software and equipment, laboratory services and training courses. More
information about JKTech can be found at http://www.jktech.com.au .
This news release contains forward-looking statements that include
statements about introduction of the Mineral Liberation Analyzer (MLA)
product and future uses and applications. Factors that could affect these
forward- looking statements include but are not limited to failure of the
product to perform as expected; failure to deliver the product as expected
and problems with our partner JKTech. Please also refer to our Form 10-K,
Forms 10-Q, Forms 8-K and other filings with the U.S. Securities and
Exchange Commission for additional information on these factors and other
factors that could cause actual results to differ materially from the
forward-looking statements. FEI assumes no duty to update forward-looking
For more information, please click here
APR Global Public Relations
+1 503 726 2695
Copyright © PR Newswire Association LLC.
If you have a comment, please Contact
Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.
University of Minnesota engineers make sound loud enough to bend light on a computer chip: Device could improve wireless communications systems November 28th, 2014
Study details laser pulse effects on behavior of electrons November 28th, 2014
Single-atom gold catalysts may offer path to low-cost production of fuel and chemicals November 28th, 2014
Production of Anticancer Drug from Nanofibers in Iran November 28th, 2014
Renishaw receives Queen's Award for spectroscopy developments November 25th, 2014
JPK reports on the use of AFM and the CellHesion module to study plant cells at the University of Queensland November 25th, 2014
A*STAR SIMTech wins international award for breaking new ground in actuators: SIMTech invention can be used in an array of industries, and is critical for next generation ultra-precision systems November 24th, 2014
Professional AFM Images with a Three Step Click SmartScan by Park Systems Revolutionizes Atomic Force Microscopy by Automatizing the Imaging Process November 24th, 2014