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The PHENOM-ED(TM) Previews on Capitol Hill in Support of Education
FEI will demonstrate the world's first tabletop scanning electron microscope (SEM) designed specifically for education on Capitol Hill today. The Phenom-Ed provides magnification up to 20,000x -- far beyond the range of traditional optical microscopes giving students access to micro- and nanoscale worlds rarely seen in undergraduate and high school studies. Congressman David Wu (D-OR), Congresswoman Darlene Hooley (D-OR), Senator Ron Wyden (D-OR) and Senator Gordon Smith (D-OR), among many other guests, will attend the unveiling.
FEI Company (Nasdaq: FEIC), a global leader in electron microscopes and focused ion beam systems, developed the microscope to bring a new teaching dimension to the classroom and foster interest in advanced science education. It is envisioned that the Phenom-Ed will provide educators a tool to greatly enhance traditional teaching methods and open the door for the next generation of innovative scientists.
"We believe that the Phenom-Ed is the future of science education. It is easy to use, affordable and truly brings the study of science, technology, engineering and math to life for students," said Don Kania, President and CEO of FEI. "The Phenom-Ed embodies the commitment to improving technical education through innovation and will enhance the infrastructure to support the growth of science and technology in the U.S."
The Phenom-Ed promotes active learning and interest in science by giving students an interactive, dynamic and fun learning tool. Fully-automated and easy-to-use, the system is the world's first electron microscope with an interactive touch screen. About the size of a desk-top PC, the Phenom-Ed is a completely self-contained high-tech laboratory that can inspire students to explore the microscopic and nanoscale structures of such specimens as, bacteria, cells, plankton, insects, pollens, metals, forensic specimens, semiconductors, minerals and more. While teachers make the connection to core curriculum topics, students remain engaged and interested.
"The Phenom-Ed brings to life aspects of science and technology that have traditionally been somewhat abstract through classroom instruction," noted Skip Rung of the Oregon Nanoscience and Microtechnologies Institute. "This table-top scanning electron microscope makes it possible to teach the scientific investigative techniques and inquiry skills that have traditionally been taught at the advanced university level."
Today's Phenom-Ed demonstrations will feature experts from the Oregon Nanoscience and Microtechnologies Institute (ONAMI), an FEI partner in developing the tabletop SEM, as well as scientists and engineers involved in the development of the microscope and professors engaged in the beta-testing phase. They will answer questions for congressional leaders and provide insight into the impact of this technology breakthrough and future opportunities for science education.
The Phenom-Ed is in the final stages of beta-testing at the Ohio State University, Jackson State University, the University of Oregon, Oregon State University, Chemeketa Community College, Winona State University, and Portland State University.
The development of the tabletop SEM was based upon work supported by the Department of Energy Solar Energy Program under Award Number DE-FG36-06GO86073 and the Department of Energy Biological and Environmental Research under Award Number DE-FG02-06ER64248.
The Phenom-Ed will be launched in the third quarter of this year. A similar table-top SEM system, optimized for a wide range of industrial applications will also be released later this year.
About the Oregon Nanoscience and Microtechnologies Institute (ONAMI)
Founded in 2003, ONAMI represents a unique collaborative model for regional micro and nanotechnology development. Its community of world-class industry, academic and federal research institutions in the Pacific Northwest forms a vibrant network of nanoscience and microtechnology expertise that is moving nanoscience and microtechnology innovations from basic research through to commercialization.
FEI (Nasdaq: FEIC) is a global leader in providing innovative instruments for nanoscale imaging, analysis and prototyping. FEI focuses on delivering solutions that provide groundbreaking results and accelerate research, development and manufacturing cycles for its customers in Semiconductor and Data Storage, Academic and Industrial R&D, and Life Sciences markets. With R&D centers in North America and Europe, and sales and service operations in more than 50 countries around the world, FEI's Tools for Nanotech(TM) are bringing the nanoscale within the grasp of leading researchers and manufacturers. More information can be found online at: http://www.fei.com .
This report was prepared as an account of work sponsored by an agency of the United States Government. Neither the United States Government nor any agency thereof, nor any of the employees, makes any warranty, express or implied, or assumes any legal liability or responsibility for the accuracy, completeness, or usefulness of any information, apparatus, product, or process disclosed or represents that its use would not infringe privately owned rights. Reference herein to any specific commercial product, process, or service by trade name, trademark, manufacturer, or otherwise does not necessarily constitute or imply its endorsement, recommendation, or favoring by the United States Government or any agency thereof. The views and opinions of authors expressed herein do not necessarily state or reflect those of the United States Government or any agency thereof.
This news release contains forward-looking statements that include statements about introduction of our new Phenom product and future uses and applications. Factors that could affect these forward-looking statements include but are not delays in releasing the product, failure of the product to perform as expected; delay of cancellation of additional development work to move the product from beta to release; technical problems arising during the beta phase; and problems with our suppliers. Please also refer to our Form 10-K, Forms 10-Q, Forms 8-K and other filings with the U.S. Securities and Exchange Commission for additional information on these factors and other factors that could cause actual results to differ materially from the forward-looking statements. FEI assumes no duty to update forward-looking statements.
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Dan Zenka of FEI Company
Melissa Matson of GolinHarris Public Relations
for FEI Company
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