Nanotechnology Now

Our NanoNews Digest Sponsors





Heifer International

Wikipedia Affiliate Button


DHgate

Home > Press > Nanosensors launches new Silicon Magnetic Force Microscopy

Abstract:
Nanosensors has launched a new series of silicon probes for Magnetic Force Microscopy (MFM) today.

Nanosensors launches new Silicon Magnetic Force Microscopy

Switzerland | Posted on February 21st, 2007

Nanosensors has launched a new series of silicon probes for Magnetic Force Microscopy (MFM) today.

For visualisation of magnetic domains by scanning probe microscopy different magnetic force microscopy probes are necessary.

Nanosensors Silicon MFM Probes are based on the well-known PointProbe Plus AFM probe. The probes are optimized in view of high sensitivity and enable Tapping Mode, Non-contact and lift mode operation in air. They are designed to match the demands of a wide range of applications defined by the variety of magnetic samples with different properties. All the different magnetic coatings of the probes show an excellent long-term stability.

The NANOSENSORS˘ Silicon MFM Probe Series offers six different types of MFM Probes.

The standard probes for Magnetic Force Microscopy feature a hard magnetic coating for high magnetic contrast and high lateral resolution.

The low momentum Magnetic Force Microscopy probes are designed for reduced disturbance of the magnetic sample by the tip and for enhanced lateral resolution. The newly introduced low coercivity Magnetic Force Microscopy probes are coated with a soft magnetic thin film enabling the measurement of magnetic domains within soft magnetic samples. Due to the low coercivity of the tip coating the magnetisation of the tip will easily get reoriented by hard magnetic samples.

For high resolution magnetic imaging the well-known Nanosensors SuperSharpSilicon tip is used as a basis and is combined with a very thin hard magnetic coating. This results in an extremely small tip radius and a high aspect ratio on the last few hundred nanometers of the tip apex ˝ the essential requirements for high lateral resolution down to 20 nm in ambient conditions.

Additionally two types of Magnetic Force Microscopy that are dedicated for the use in ultra high vacuum have been developed.

A special version of the high resolution magnetic force microscopy probe was especially tailored for applications in UHV combining high resolution with a typical Q-factor of over 35 000 under UHV conditions.

The second special MFM probe for UHV is a low coercivity magnetic force probe that enables the measurement of magnetic domains within soft magnetic samples and also features a typical Q-factor of over 35 000 under UHV conditions.
With this new product introduction Nanosensors is now able to supply its customers with all basic probes needed for the various types of Magnetic Force Microscopy. Customized solutions for special needs are available upon request.

####

About NanoSensors, Inc.
Nanosensors is specializing in the development and production of innovative high quality probes for scanning probe microscopy (SPM) and atomic force microscopy (AFM). The products are especially designed for scientists at universities, research institutions and industrial R&D centres in the fields of nanotechnology, microtechnology, materials research, semiconductors, biology, biotechnology, chemistry and medicine. NANOSENSORS is a trademark of NanoWorld AG.

For more information, please click here

Contacts:
Denitsa Yordanova
Phone: +41-(0)32-720-5085
Fax: +41-(0)32-720-5792

Copyright © Nanosensors, Inc.

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

Announcements

For 2-D boron, it's all about that base: Rice University theorists show flat boron form would depend on metal substrates September 2nd, 2015

Silk bio-ink could help advance tissue engineering with 3-D printers September 2nd, 2015

Phagraphene, a 'relative' of graphene, discovered September 2nd, 2015

A marine creature's magic trick explained: Crystal structures on the sea sapphire's back appear differently depending on the angle of reflection September 2nd, 2015

Tools

Nanolab Technologies LEAPS Forward with High-Performance Analysis Services to the World: Nanolab Orders Advanced Local Electrode Atom Probe (LEAP«) Microscope from CAMECA Unit of AMETEK Materials Analysis Division August 27th, 2015

Nanometrics to Participate in the Citi 2015 Global Technology Conference August 26th, 2015

50 Years of Scanning Electron Microscopy from ZEISS: ZEISS celebrates the birth of the first commercial scanning electron microscope in 1965 August 26th, 2015

Announcing Oxford Instruments and School of Physics signing a Memorandum of Understanding August 26th, 2015

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More











ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







Car Brands
Buy website traffic