Nanotechnology Now

Our NanoNews Digest Sponsors





Heifer International

Wikipedia Affiliate Button


android tablet pc

Home > Press > Breakthrough Dual Beam Detector Creates a New Standard for FIB/SEM Performance

Abstract:
The Elion™ Dual Detection Platform, El-Mul Technologies' revolutionary electron and ion beam hybrid detector, has been chosen by a leading FIB/SEM instrument manufacturer for integration into its advanced line of 2007 products.

Breakthrough Dual Beam Detector Creates a New Standard for FIB/SEM Performance

YAVNE, ISRAEL | Posted on February 20th, 2007

The patent-pending Elion platform has already resulted in a new industry standard for secondary ion and electron detection in FIB/SEM instruments, and brings a new level of detection efficiency and versatility to dual beam instruments.

The Elion produces unsurpassed secondary ion imaging quality at much lower currents, greatly reducing sample damage. This means that the ion beam can now be used to perform routine sample imaging, where its high resolution and unique material contrast capabilities provide valuable diagnostic input for the operator. Until now, ion beams have been used widely for sample manipulation, but rarely for imaging because of the associated sample damage.

"We saw the lack of an integrated secondary ion detector as a serious obstacle to the advancement of ion-based imaging and dual beam tools, so we decided to engineer the ideal solution," said Dr. Armin Schon, CEO of El-Mul Technologies, one of the principal developers of the platform. "Our Elion dual detection standard is the one to beat."

Current generation FIB/SEM dual beam instruments use separate chamber devices in order to detect ions and electrons that emerge from samples. Redundant detectors are a burden to chamber resources and space. Also, these detectors quickly lose their efficiency under secondary ion bombardment, which in turn severely reduces image quality. Prior detector combination attempts have failed, due to short operational lifetimes and low sensitivity for secondary ions.

El-Mul's Elion is the first commercial platform to combine ion and electron mode detection in a single device without compromising either mode. Elion's proprietary ion converter is highly efficient for secondary ions, providing a 10- to 100-fold improvement in ion detection. At the same time, the converter is completely transparent to secondary electrons in electron beam mode, so no conversion noise is added to the SE image. Elion's design also significantly improves SE detection over current chamber devices. Finally, during scanning, only Elion's ion converter is exposed to ion bombardment, which results in longer detector operating lifetimes at peak performance.

The Elion is a fully customized system with field replaceable 'plug-in' components, designed to dramatically reduce the cost of maintenance. Because it occupies the ETD slot in the instrument, it also economizes on chamber space, ports and video electronics.


####

About El-Mul Technologies
El-Mul Technologies has over 15 years experience in the design and manufacture of electron and ion detectors for a wide variety of industries and research environments, and is recognized today as a leading solutions provider for nanotechnology toolmakers.

For more information, please click here

Contacts:
El-Mul Technologies:
Noa Even-Tal
Assistant to the CEO
+972 8-943-4184

Copyright © Market Wire

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

Announcements

Berkeley Lab Researchers Demonstrate First Size-based Chromatography Technique for the Study of Living Cells April 22nd, 2014

PETA science consortium to present hazard testing strategy at nanotoxicology meeting: High tech field ripe for use of sophisticated non-animal testing strategies April 22nd, 2014

Harris & Harris Group Notes the Receipt of Proceeds From the Sale of Molecular Imprints' Semiconductor Business to Canon April 22nd, 2014

National Space Society Congratulates SpaceX on the Success of CRS-3 and the First Flight of the Falcon 9R April 22nd, 2014

Tools

MRI, on a molecular scale: Researchers develop system that could one day peer into the atomic structure of individual molecules April 20th, 2014

Oxford Instruments Asylum Research Introduces the MFP-3D InfinityTM AFM Featuring Powerful New Capabilities and Stunning High Performance April 18th, 2014

More effective kidney stone treatment, from the macroscopic to the nanoscale April 17th, 2014

Aerotech X-Y ball-screw stage for economical high performance Planar positioning April 16th, 2014

NanoNews-Digest
The latest news from around the world, FREE







  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More














ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







© Copyright 1999-2014 7th Wave, Inc. All Rights Reserved PRIVACY POLICY :: CONTACT US :: STATS :: SITE MAP :: ADVERTISE