- About Us
- Career Center
- Nano-Social Network
- Nano Consulting
- My Account
-Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces the winners of its Nanotechnology Test & Measurement Applications Contest. Keithley teamed up with the editors of R&D Magazine, who selected three winners amongst entries that were received from as far away as Singapore. First place ($2500) has been awarded to Dr. Simon Prussin and Jason Reyes of the UCLA Dept. of Electrical Engineering, second place ($1500) to Rahul Gupta of the University of Delaware (Newark), and third place ($1000) to Ryan Major and David Vodnick of Hysitron, Inc. in Minneapolis. The contest objective was to foster development and propagation of improved test techniques to advance nanotech measurement art. Researchers who submitted entries are making complex and advanced measurements for applications as diverse as characterization of carbon nanotubes, electrical contact resistance, electrode spacing via atomic layer deposition, characterization of semiconductor junctions, and studies of nanoscale electrochemical modification in electronic devices.
Each entry was evaluated by the R&D Magazine editorial staff based on four criteria:
1. Did it advance the state of the art in nanotech testing?
2. Was it an advance over earlier test methods?
3. What level of accuracy did the solution provide?
4. What test time was required for making the measurement?
The three innovative test techniques submitted by the contest winners are:
First Place ($2500) - Rapid, accurate, and non-destructive measurements of resistivity and activated dopant profiles in ultra shallow junctions (down to approximately 3 angstroms, or one atomic layer of silicon) by Dr. Simon Prussin and Jason Reyes of the UCLA Dept. of Electrical Engineering.
Second Place ($1500) - Measurement and control of nanoamp level currents in the formation of nanoscale device electrodes (spacing in the 1-10nm range) using atomic layer deposition by Rahul Gupta of the University of Delaware (Newark).
Third Place ($1000) - In-situ I-V and electrical contact resistance measurements, providing time-based correlation with other measurements on nanoscale devices, such as force and displacement during controlled load or displacement conditions by Ryan Major and David Vodnick of Hysitron, Inc., Minneapolis.
The contest encouraged researchers and development engineers to share electrical measurement techniques that will help the industry at large grapple with significant challenges in miniaturization and nanotechnology. Electrical measurements play a pivotal role in developing new materials and devices - even those not intended for electronic applications. All the contest entrants have developed improved techniques to help overcome nanotech research measurement problems.
Keithley Instruments is the world leader in the creation of electrical measurement solutions for nanotechnology. This important new area of research promises significant advances in electronics, materials, biotechnology, alternative energy sources, and dozens of other applications. With their unequalled performance, Keithley measurement tools enable nanotechnology researchers to observe phenomena that were impossible just a few years ago.
Unlocking secrets at the nanoscale level is accelerating the transition from nanotech research labs to commercial production.
For More Information. For an overview of Keithley products used in nanotechnology measurement applications, and a free copy of the brochure "Discover Today's Solutions for Tomorrow's Nano-Characterization Challenges," visit www.keithley.com/nano. For information on other Keithley products and services, contact the company at:
Address: Keithley Instruments, Inc.
28775 Aurora Road
Cleveland, OH 44139-1891
About Keithley Instruments
With more than 60 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test instruments and systems from DC to RF (radio frequency). Our products solve emerging measurement needs in production testing, process monitoring, product development, and research. Our customers are scientists and engineers in the worldwide electronics industry involved with advanced materials research, semiconductor device development and fabrication, and the production of end products such as portable wireless devices. The value we provide them is a combination of precision measurement technology and a rich understanding of their applications to improve the quality of their products and reduce their cost of test.
Products and company names listed are trademarks or trade names of their respective companies.
For more information, please click here
Keithley Instruments, Inc.
Ellen Modock, 440-498-2746
Reader Inquiries: 1-800-688-9951
Copyright © Business WireIf you have a comment, please Contact us.
Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.
|Related News Press|
Squeezed quantum cats May 28th, 2015
New chip makes testing for antibiotic-resistant bacteria faster, easier: Researchers at the University of Toronto design diagnostic chip to reduce testing time from days to one hour, allowing doctors to pick the right antibiotic the first time May 28th, 2015
Collaboration could lead to biodegradable computer chips May 28th, 2015
Physicists solve quantum tunneling mystery: ANU media release: An international team of scientists studying ultrafast physics have solved a mystery of quantum mechanics, and found that quantum tunneling is an instantaneous process May 27th, 2015
This Slinky lookalike 'hyperlens' helps us see tiny objects: The photonics advancement could improve early cancer detection, nanoelectronics manufacturing and scientists' ability to observe single molecules May 23rd, 2015
One step closer to a single-molecule device: Columbia Engineering researchers first to create a single-molecule diode -- the ultimate in miniaturization for electronic devices -- with potential for real-world applications May 25th, 2015
What makes cancer cells spread? New device offers clues May 19th, 2015
International and U.S. Students and Teachers Headed to Toronto for 34th Annual International Space Development ConferenceŽ: Students competed in prestigious NSS-NASA Ames Space Settlement Design Contest May 9th, 2015