Nanotechnology Now

Our NanoNews Digest Sponsors



Heifer International

Wikipedia Affiliate Button


android tablet pc

Home > Press > Winners of Keithley Instruments Nanotech Measurement Contest Share $5000 in Cash Prizes for Innovative Test Techniques

Abstract:
-Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces the winners of its Nanotechnology Test & Measurement Applications Contest. Keithley teamed up with the editors of R&D Magazine, who selected three winners amongst entries that were received from as far away as Singapore. First place ($2500) has been awarded to Dr. Simon Prussin and Jason Reyes of the UCLA Dept. of Electrical Engineering, second place ($1500) to Rahul Gupta of the University of Delaware (Newark), and third place ($1000) to Ryan Major and David Vodnick of Hysitron, Inc. in Minneapolis. The contest objective was to foster development and propagation of improved test techniques to advance nanotech measurement art. Researchers who submitted entries are making complex and advanced measurements for applications as diverse as characterization of carbon nanotubes, electrical contact resistance, electrode spacing via atomic layer deposition, characterization of semiconductor junctions, and studies of nanoscale electrochemical modification in electronic devices.

Winners of Keithley Instruments Nanotech Measurement Contest Share $5000 in Cash Prizes for Innovative Test Techniques

Cleveland, OH | Posted on February 13th, 2007

Each entry was evaluated by the R&D Magazine editorial staff based on four criteria:

1. Did it advance the state of the art in nanotech testing?

2. Was it an advance over earlier test methods?

3. What level of accuracy did the solution provide?

4. What test time was required for making the measurement?

The three innovative test techniques submitted by the contest winners are:

First Place ($2500) - Rapid, accurate, and non-destructive measurements of resistivity and activated dopant profiles in ultra shallow junctions (down to approximately 3 angstroms, or one atomic layer of silicon) by Dr. Simon Prussin and Jason Reyes of the UCLA Dept. of Electrical Engineering.

Second Place ($1500) - Measurement and control of nanoamp level currents in the formation of nanoscale device electrodes (spacing in the 1-10nm range) using atomic layer deposition by Rahul Gupta of the University of Delaware (Newark).

Third Place ($1000) - In-situ I-V and electrical contact resistance measurements, providing time-based correlation with other measurements on nanoscale devices, such as force and displacement during controlled load or displacement conditions by Ryan Major and David Vodnick of Hysitron, Inc., Minneapolis.

The contest encouraged researchers and development engineers to share electrical measurement techniques that will help the industry at large grapple with significant challenges in miniaturization and nanotechnology. Electrical measurements play a pivotal role in developing new materials and devices - even those not intended for electronic applications. All the contest entrants have developed improved techniques to help overcome nanotech research measurement problems.

Keithley Instruments is the world leader in the creation of electrical measurement solutions for nanotechnology. This important new area of research promises significant advances in electronics, materials, biotechnology, alternative energy sources, and dozens of other applications. With their unequalled performance, Keithley measurement tools enable nanotechnology researchers to observe phenomena that were impossible just a few years ago.

Unlocking secrets at the nanoscale level is accelerating the transition from nanotech research labs to commercial production.

For More Information. For an overview of Keithley products used in nanotechnology measurement applications, and a free copy of the brochure "Discover Today's Solutions for Tomorrow's Nano-Characterization Challenges," visit www.keithley.com/nano. For information on other Keithley products and services, contact the company at:
Telephone: 800-688-9951
440-248-0400
FAX: 440-248-6168

E-mail:



Internet:

http://www.keithley.com
Address: Keithley Instruments, Inc.
28775 Aurora Road
Cleveland, OH 44139-1891

####

About Keithley Instruments
With more than 60 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test instruments and systems from DC to RF (radio frequency). Our products solve emerging measurement needs in production testing, process monitoring, product development, and research. Our customers are scientists and engineers in the worldwide electronics industry involved with advanced materials research, semiconductor device development and fabrication, and the production of end products such as portable wireless devices. The value we provide them is a combination of precision measurement technology and a rich understanding of their applications to improve the quality of their products and reduce their cost of test.

Products and company names listed are trademarks or trade names of their respective companies.

For more information, please click here

Contacts:
Keithley Instruments, Inc.
Ellen Modock, 440-498-2746

Reader Inquiries: 1-800-688-9951

Copyright © Business Wire

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

Announcements

Graphene chips are close to significant commercialization October 1st, 2014

Production of Filters for Separation of Water from Petroleum Products in Iran October 1st, 2014

New Topical Hemostatic Agent: Neutral Self-Assembling Peptide Hydrogel September 30th, 2014

Chemical interactions between silver nanoparticles and thiols: A comparison of mercaptohexanol again September 30th, 2014

Tools

Yale University and Leica Microsystems Partner to Establish Microscopy Center of Excellence: Yale Welcomes Scientists to Participate in Core Facility Opening and Super- Resolution Workshops October 20 Through 31, 2014 September 30th, 2014

Park Systems Announces Outsourced Analytical Services Including AFM Surface Imaging, Data Analysis and Interpretation September 30th, 2014

Iranian Scientists Determine Grain Size, Minimize Time of Nanocomposite Synthesis September 29th, 2014

Oxford Instruments launches 3rd annual Indian nanotechnology seminars in Kolkata and Delhi - sharing expertise with Nanotechnology researchers in India September 25th, 2014

Grants/Awards/Scholarships/Gifts/Contests/Honors/Records

A Heartbeat Away? Hybrid "Patch" Could Replace Transplants: TAU researcher harnesses gold nanoparticles to engineer novel biocompatible cardiac patch September 30th, 2014

Teijin Aramidís carbon nanotube fibers awarded with Paul Schlack prize: New generation super fibers bring wave of innovations to fiber market September 25th, 2014

New chip promising for tumor-targeting research September 22nd, 2014

SouthWest NanoTechnologies (SWeNT) Receives NIST Small Business Innovation Research (SBIR) Phase 1 Award to Produce Greater than 99% Semiconducting Single-Wall Carbon Nanotubes September 19th, 2014

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More














ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







© Copyright 1999-2014 7th Wave, Inc. All Rights Reserved PRIVACY POLICY :: CONTACT US :: STATS :: SITE MAP :: ADVERTISE