Nanotechnology Now

Our NanoNews Digest Sponsors

Heifer International

Wikipedia Affiliate Button

Home > Press > New IEST Working Group Meetings at ESTECH 2007

Abstract:
Two new working groups will meet to develop Recommended Practices during ESTECH 2007, the Institute of Environmental Sciences and Technology (IEST) annual technical meeting and exposition. The conference will take place April 29-May 2, 2007 at the Indian Lakes Resort in Bloomingdale (northwest suburban Chicago), Illinois.

New IEST Working Group Meetings at ESTECH 2007

ROLLING MEADOWS, IL | Posted on January 17th, 2007

Liquid-borne particle measurement in the semiconductor industry involves many technical challenges, which if not handled properly can substantially affect the measurement results, both in the sizing and the counting of the particles. The new working group on Liquid-borne Particle Counting will focus on developing a new Recommended Practice (RP). The RP will cover topics such as types of LPC instruments, bubble issues, refractive index ratio effect, coincidence level, cumulative versus differential counts, lower detection limit, and particle extraction methods.

Highly Accelerated Life Testing (HALT) and Highly Accelerated Stress Screening (HASS) uncover design defects and weaknesses in electronic and mechanical assemblies to help deliver better products to the marketplace. The new working group titled HALT and HASS, meeting for the first time at ESTECH 2007, will discuss these test methods.

IEST offers Recommended Practices on a broad range of topics. A Recommended Practice Update session will highlight provisions of the most widely used documents published by the Design, Test, and Evaluation/Product Reliability Division. Members of existing IEST Working Groups and other interested persons are invited and encouraged to attend.

Registration and the advance program can be found at http://www.iest.org/estech/estech.htm . Do not forget to sign up for the ESTECH 2007 Golf Outing to be held Sunday, April 29 at 1 p.m.

####

About IEST
Founded in 1953, IEST is an international technical society of engineers, scientists, and educators that serves its members and the industries they represent (simulating, testing, controlling, and teaching the environments of earth and space) through education and the development of recommended practices and standards.

IEST is an ANSI-accredited standards-developing organization; Secretariat of ISO/TC 209 Cleanrooms and associated controlled environments; Administrator of the ANSI-accredited US TAG to ISO/TC 209; Administrator of the ANSI-accredited US TAG to ISO/TC 142 Cleaning equipment for air and other gases; and a founding member of the ANSI-accredited US TAG to ISO/TC 229 Nanotechnologies.

For more information, please click here

Contacts:
Heather Dvorak, Ext. 25
Phone: (847) 255-1561
Fax: (847) 255-1699

Copyright © IEST

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

Announcements

A big leap toward tinier lines: Self-assembly technique could lead to long-awaited, simple method for making smaller microchip patterns March 27th, 2017

“Cysteine Rose” Wins 2016 Thermo Fisher Scientific Electron Microscopy Image Contest: Thermo Fisher honors Andrea Jacassi of the Italian Institute of Technology for image of cysteine crystals using focused ion beam techniques March 27th, 2017

ATTOPSEMI Technology Joins FDXcelerator Program to Deliver Advanced Non-Volatile Memory IP to GLOBALFOUNDRIES 22 FDX® Technology Platform: Leading-edge I-fuse™ brings higher reliability, smaller cell size and ease of programmability for consumer, automotive, and IoT applications March 27th, 2017

Leti and HORIBA Scientific to Host Webinar on Ultrafast Characterization Tool: Plasma Profiling Time-of-Flight Mass Spectrometer Tool Cuts Optimization Time In Layer Deposition and Fabrication of Wide Range of Applications March 27th, 2017

Events/Classes

Leti and HORIBA Scientific to Host Webinar on Ultrafast Characterization Tool: Plasma Profiling Time-of-Flight Mass Spectrometer Tool Cuts Optimization Time In Layer Deposition and Fabrication of Wide Range of Applications March 27th, 2017

Leti Presents Advances in Propagation Modeling and Antenna Design for mmWave Spectrum: Paper Is One of 15 that Leti Presented at European Conference on Antennas and Propagation March 19-24 March 23rd, 2017

Next-gen steel under the microscope March 18th, 2017

UC researchers use gold coating to control luminescence of nanowires: University of Cincinnati physicists manipulate nanowire semiconductors in pursuit of making electronics smaller, faster and cheaper March 17th, 2017

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More











ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project