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Home > News > Applied Materials' UVision SP Solves Defect Inspection Challenges

December 5th, 2006

Applied Materials' UVision SP Solves Defect Inspection Challenges

Abstract:
Applied Materials, Inc. (Nasdaq:AMAT) today announced that its Applied UVision® SP brightfield inspection system has achieved a significant breakthrough in resolving defect inspection challenges related to immersion[1] lithography at the College of Nanoscale Science and Engineering (CNSE) of the University at Albany's Albany NanoTech complex.

Source:
businesswire.com

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