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Home > News > Hyphenated Systems Unveils New NanoScale Optical Profiler

November 29th, 2006

Hyphenated Systems Unveils New NanoScale Optical Profiler

The NanoScale Optical Profiler acquires a series of images that slice through the sample at varying heights, then combines these images into a three-dimensional model of the sample. Its unique ability to collect data simultaneously through multiple confocal apertures greatly accelerates the data acquisition process, allowing it to construct and display 3D images in seconds.


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