Home > News > Hyphenated Systems Unveils New NanoScale Optical Profiler
November 29th, 2006
Hyphenated Systems Unveils New NanoScale Optical Profiler
Abstract:
The NanoScale Optical Profiler acquires a series of images that slice through the sample at varying heights, then combines these images into a three-dimensional model of the sample. Its unique ability to collect data simultaneously through multiple confocal apertures greatly accelerates the data acquisition process, allowing it to construct and display 3D images in seconds.
Source:
laboratorynetwork.com
Bookmark:
Announcements
Pioneering breakthrough of chemical nanoengineering to design drugs controlled by light June 18th, 2013
Study Shows How the Nanog Protein Promotes Growth of Head and Neck Cancer June 18th, 2013
New Method to Synthesize Zinc Oxide Nanoparticles with High Catalytic Activity June 18th, 2013
Production of Polyaniline Biosensors Modified with Conductive Polymer Composites June 18th, 2013
Tools
Pioneering breakthrough of chemical nanoengineering to design drugs controlled by light June 18th, 2013
METTLER TOLEDO launches new microgram weights Combined with unique calibration service from the UK's NMO June 17th, 2013
Hitachi announces the SU8200 – a new type of cold field emitter SEM June 17th, 2013
Efficient and inexpensive: Researchers develop catalyst material for fuel cells: Platinum-nickel nano-octahedra save 90 percent platinum June 17th, 2013