Nanotechnology Now





Heifer International

Wikipedia Affiliate Button


DHgate

Home > News > Nanometer ICs have stringent testing requirements

October 25th, 2006

Nanometer ICs have stringent testing requirements

Abstract:
As the EDA industry focuses on design-for-manufacturability (DFM), the older problem of design-for-test has almost been forgotten. But ICs built at 90 nanometers and below pose new and troubling challenges for DFT tools and techniques, according to providers who will take part in this week's International Test Conference here.

Source:
EETimes

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

Nanoelectronics

New technology using silver may hold key to electronics advances July 2nd, 2015

Exagan Raises 5.7 Million to Produce High-efficiency GaN-on-Silicon Power-switching Devices on 200mm Wafers: Leti-and-Soitec Spinout Focused on Becoming Leading European Source Of GaN Devices for Solar, Automotive, Telecoms and Infrastructure June 25th, 2015

Nanowires could be the LEDs of the future June 25th, 2015

Leti to Present Solutions to New Applications Using 3D Technologies at SEMICON West LetiDay Event, July 14: Leti Experts also Will Speak at TechXPOT Session on MEMS and STS Session on Lithography Cost-and-Productivity Issues Below 14nm June 22nd, 2015

Announcements

Pioneering Southampton scientist awarded prestigious physics medal July 3rd, 2015

Groundbreaking research to help control liquids at micro and nano scales July 3rd, 2015

Producing spin-entangled electrons July 2nd, 2015

NIST Group Maps Distribution of Carbon Nanotubes in Composite Materials July 2nd, 2015

NanoNews-Digest
The latest news from around the world, FREE




  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More










ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project