- About Us
- Career Center
- Nano-Social Network
- Nano Consulting
- My Account
New NanoIndenter™ Module for the MFP-3D™ Atomic Force Microscope
Santa Barbara, CA | Posted on July 18, 2006
Asylum Research, a leading manufacturer of atomic force microscopes (AFMs), announces the availability of the new NanoIndenter module for use with the Asylum Research MFP-3D AFM System.
The NanoIndenter is the first commercially available product to bridge the gap between conventional nanoindenters and AFMs. Unlike cantilever-based nanoindenters (AFMs), the NanoIndenter drives the nanoindenting tip perpendicular to the sample. And unlike conventional nanoindenters, tip displacement and force are measured with the MFP-3D AFM’s optical detector and the patent-pending NPS™ Nanopositioning sensors. This combination results in exquisite force and positioning sensitivity. This allows repeatable imaging, quantitative feature measurement, reliable and accurate imaging offsets, quantitative force curves, and incredibly precise positioning for manipulation and lithography.
Indentation and scratch on polyurethane film, 17µm scan.
“Because the NanoIndenter is truly integrated with the premier metrology AFM, the MFP-3D, the user can measure forces and displacements with near AFM precision while avoiding the non-orthogonality issues that plague cantilever-based indentation measurements. This integration means that users can easily image the indenter tip itself and characterize its shape,” said Flavio Bonilla, Product Manager for the NanoIndenter.
“The software scripting ability native to the MFP-3D environment also makes this product ideal for scientists automating measurements or working on new ways of characterizing materials.”
The NanoIndenter easily fits on the MFP-3D AFM head for easy viewing of the sample. It is available in two models, Standard and Low Force. The module comes with three standard sample mounts, small, medium and large.
Measurements and surface characterization can be done on many different materials including thin films, coatings, polymers, etc. The NanoIndenter is ideal for a variety of applications including the elastic and inelastic behavior of materials; dislocation phenomena; fractures in ceramics; mechanical behavior of metals, thin films, ceramics, bone, biomaterials, residual stresses; and time dependent mechanical characteristics in soft metals and polymers.
About Asylum Research:
Asylum Research manufactures advanced scientific instrumentation, including AFMs/Scanning Probe Microscopes (SPMs), for nanoscale science and technology. An AFM/SPM is used for visualizing surfaces and measuring surface properties at the nanometer level.
For more information, please click here.
Director of Marketing
6310 Hollister Ave., Santa Barbara, CA 93117
Copyright © Asylum Research
If you have a comment, please Contact us.
Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.
|Related News Press|
Ultrasensitive sensor using N-doped graphene July 26th, 2016
Nanometrics Reports Second Quarter 2016 Financial Results July 26th, 2016
The NanoWizard® AFM from JPK is applied for interdisciplinary research at the University of South Australia for applications including smart wound healing and how plants can protect themselves from toxins July 26th, 2016