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Home > News > Advanced microscope installed for materials analysis

November 17th, 2005

Advanced microscope installed for materials analysis

Abstract:
Ohio State University's Center for Accelerated Maturation of Materials (CAMM) has begun using the FEI Titan 80-300 microscope, reported to be the world's highest-resolution, commercially available, scanning/transmission electron microscope (S/TEM).

Source:
manufacturing.net

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