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Home > Press > New MFP-3D™ Extended Atomic Force Microscopy Scan Head

New MFP-3D™ Extended Atomic Force Microscopy Scan Head for High Feature Samples

Santa Barbara, CA | August 16, 2005

Asylum Research, a leading manufacturer of atomic force microscopes (AFMs), announces the availability of the new MFP-3D Extended Head for use in its MFP-3D Atomic Force Microscopy (AFM) Systems. The new head design allows a 28µm scan range in Z for samples with higher features, and in particular, for bioscience applications including living cells, plant imaging, and for pulling on long chained molecules.

MFP-3D Extended Head. Copyright © Asylum Research
Click on image for larger version.

The MFP-3D Extended Head utilizes the same Nanopositioning System (NPS™) sensors found in the standard head for unprecedented precision and accuracy, low noise, and image clarity. Z Sensor noise is <0.3nm Adev in a 0.1 Hz-1 kHz bandwidth (BW) and sensor non-linearity less than 0.2% (Adev/full travel) at full scan; Z height noise <0.06nm Adev, 0.1 Hz-1kHz BW.

MFP-3D is a trademark of Asylum Research


About Asylum Research:
Asylum Research manufactures advanced scientific instrumentation, including AFMs/ Scanning Probe Microscopes (SPMs), for nanoscale science and technology. An AFM/SPM is one of the premier instruments used for measuring surfaces and surface properties at the nanometer level.

For more information, please visit

Terry Mehr
Director of Marketing
Asylum Research
6310 Hollister Ave.,
Santa Barbara, CA 93117

Copyright © Asylum Research

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