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Home > News > Sub-angstrom microscope targets nanotechnology

August 1st, 2005

Sub-angstrom microscope targets nanotechnology

FEI Co. unveiled the new device at the Microscopy & Microanalysis conference this week in Honolulu. FEI claims its commercial instrument resolves at the sub-angstrom scale for the first time. Designed for nanotechnology development, FEIís microscope, called the Titan 80-300, enables sub-angstrom (atomic scale) imaging and analysis.


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