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Home > News > FEI Introduces H & S Upgrades For Tecnai(TM) G2 TEM

August 1st, 2005

FEI Introduces H & S Upgrades For Tecnai(TM) G2 TEM

Abstract:
FEI released new software and hardware for its market-leading Tecnai(TM) G2 transmission electron microscope (TEM) at Microscopy and Microanalysis 2005 Conference today in Honolulu. The new software (Tecnai 3.0) delivers enhanced ease of operation of the Tecnai TEM and ensures full benefit of the system's leading- edge performance. The new hardware features an innovative computer-based technology, Inspect3D Xpress, for unprecedented speed with 3D image reconstruction.

Source:
FEI

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