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Home > News > Malvern to Display New Particle Characterization Systems

July 14th, 2005

Malvern to Display New Particle Characterization Systems

Abstract:
Malvern Instruments will introduce a new particle size and shape analyzer based on image analysis at Powtech 2005 (Nürnberg, 11-13 October, 2005).

Source:
pandct.com

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