Home > News > Malvern to Display New Particle Characterization Systems
July 14th, 2005
Malvern to Display New Particle Characterization Systems
Abstract:
Malvern Instruments will introduce a new particle size and shape analyzer based on image analysis at Powtech 2005 (Nürnberg, 11-13 October, 2005).
Source:
pandct.com
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