Nanotechnology Now - News Story: "Malvern to Display New Particle Characterization Systems"

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July 7th, 2005

Malvern to Display New Particle Characterization Systems

Abstract:
Malvern Instruments will introduce a new particle size and shape analyzer based on image analysis at Powtech 2005 (Nürnberg, 11-13 October, 2005).

Source:
pharmalive.com

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