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Home > News > Multiscan Atomic Force Probe with Ultra Stable Platform

May 13th, 2005

Multiscan Atomic Force Probe with Ultra Stable Platform

Abstract:
The X series Nanoprober combines a rock-solid platform with the high performance Multiscan Atomic Force Probe (AFP) for high tool efficiency and lab productivity. It is for 45 nm, 65 nm, 90 nm and larger process technology measurements and PicoCurrent imaging capabilities.

Source:
labequipmag.com

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