Home > News > Pushing the limits of SPM
May 2nd, 2005
Pushing the limits of SPM
In the two decades since the invention of the scanning tunneling microscope (STM), the family of local probing techniques known as scanning probe microscopy (SPM) has come to full maturity. Nowadays, the quality with which nanoscale images can be obtained and local spectroscopic information acquired using these instruments is spectacular. In addition, the ease of use of these machines has improved so much that they have found their way into the laboratories, not just of physicists, but also chemists, biologists, and engineers.
This article reviews two recent developments in SPM technology: high-speed imaging and imaging under extreme conditions.
Russia’s Nano-enabled Products Market to Witness Massive Growth February 8th, 2011
Adept Technology Announces Orders for Over $600K from Chinese Partner January 18th, 2011
Nanostart-held ItN Nanovation Receives Major Follow-on Order in Saudi Arabia November 29th, 2010
Homegrown Companies Developing Batteries for Clean Energy Storage November 2nd, 2010
Switching to spintronics: Berkeley Lab reports on electric field switching of ferromagnetism at room temp December 17th, 2014
ORNL microscopy pencils patterns in polymers at the nanoscale December 17th, 2014
Unraveling the light of fireflies December 17th, 2014
DELMIC reports on applications of their SPARC technology at the Chalmers University of Technology in Gothenburg, Sweden December 16th, 2014