Nanotechnology Now

Our NanoNews Digest Sponsors

Heifer International

Wikipedia Affiliate Button

Home > Press > Ambios Releases Powerful New Software For Metrology Tools

Abstract:
Automated features improve repeatability and time saving functions

Ambios Technology, Inc. Releases Powerful New Software For Metrology Tools

Ambios Technology

Santa Cruz, CA | March 25, 2005

The latest software release from Ambios Technology, Inc. adds sophisticated automated features that improve repeatability and time saving functions in use with their high resolution optical profilers for the general industrial and academic marketplaces.

With the new software version (Version 5.5.2) an operator has programming control to preset stage locations for repetitive measurements integral to accurate data acquisition, timely throughput, and decreased errors in operation. With the programmable stage preset functionality, an operator can program up to ten stage positions ensuring repetitive measurements, and allow easier sample interchanging without the need for reprogramming stage position with every load. Other new features include: step detection, auto level, auto measure, scan stitching, and multiple profile loads. These functions enable operators to extend the profile range of the instrument, allowing larger scan lengths, repeat multiple scans with the same parameters, and view analysis data in “batch” format.

The move toward more automated capabilities is in part a response to consumer requests in Research and Development and other markets, as well as a continued company commitment to enhancing its surface analysis products. Ambios Technology’s profilers continue to be an ideal measurement tool in the R&D world, as well as a capable tool in the MEMS and nanotechnology fields.

####


About Ambios Technology
Established in 1996, Ambios Technology headquartered in California, USA, is a manufacturer of high performance, low cost bench top metrology measurement equipment for the academic and general industrial research marketplaces.

For more information, visit www.ambiostech.com



Contact:
Stacy M. Berno
Ambios Technology, Inc.
100 Pioneer Street, Suite A
Santa Cruz, California 95060
831.429.4200
831.427.1160 fax
www.ambiostech.com

Copyright © Ambios Technology

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

Announcements

Zap! Graphene is bad news for bacteria: Rice, Ben-Gurion universities show laser-induced graphene kills bacteria, resists biofouling May 22nd, 2017

Leti Will Demo World’s-first WVGA 10-µm Pitch GaN Microdisplays for Augmented Reality Video at Display Week in Los Angles: Invited Paper also Will Present Leti’s Success with New Augmented Reality Technology That Reduces Pixel Pitch to Less than 5 Microns May 22nd, 2017

Sensors detect disease markers in breath May 19th, 2017

Graphene-nanotube hybrid boosts lithium metal batteries: Rice University prototypes store 3 times the energy of lithium-ion batteries May 19th, 2017

Tools

Plasmon-powered upconversion nanocrystals for enhanced bioimaging and polarized emission: Plasmonic gold nanorods brighten lanthanide-doped upconversion superdots for improved multiphoton bioimaging contrast and enable polarization-selective nonlinear emissions for novel nanoscal May 19th, 2017

The brighter side of twisted polymers: Conjugated polymers designed with a twist produce tiny, brightly fluorescent particles with broad applications May 16th, 2017

Racyics Launches ‘makeChip’ Design Service Platform for GLOBALFOUNDRIES’ 22FDX® Technology: Racyics will provide IP and design services as a part of the foundry’s FDXcelerator™ Partner Program May 11th, 2017

UnitySC Announces Wafer Thinning Inspection System; Win from Power Semiconductor IDM for Automotive: Leading IDM Selects New 4See Series Automated Defect Inspection Platform for Power Semiconductor Automotive Applications May 11th, 2017

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More











ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project