Home > Press > Ambios Releases Powerful New Software For Metrology Tools
Automated features improve repeatability and time saving functions
Ambios Technology, Inc. Releases Powerful New Software For Metrology Tools
Santa Cruz, CA | March 25, 2005
The latest software release from Ambios Technology,
Inc. adds sophisticated automated features that improve repeatability and time saving
functions in use with their high resolution optical profilers for the general industrial and
With the new software version (Version 5.5.2) an operator has programming control to
preset stage locations for repetitive measurements integral to accurate data acquisition,
timely throughput, and decreased errors in operation. With the programmable stage preset
functionality, an operator can program up to ten stage positions ensuring repetitive
measurements, and allow easier sample interchanging without the need for reprogramming
stage position with every load. Other new features include: step detection, auto level, auto
measure, scan stitching, and multiple profile loads. These functions enable operators to
extend the profile range of the instrument, allowing larger scan lengths, repeat multiple
scans with the same parameters, and view analysis data in “batch” format.
The move toward more automated capabilities is in part a response to consumer requests in
Research and Development and other markets, as well as a continued company
commitment to enhancing its surface analysis products. Ambios Technology’s profilers
continue to be an ideal measurement tool in the R&D world, as well as a capable tool in the
MEMS and nanotechnology fields.
About Ambios Technology
Established in 1996, Ambios Technology headquartered in California, USA, is a
manufacturer of high performance, low cost bench top metrology measurement equipment
for the academic and general industrial research marketplaces.
For more information, visit www.ambiostech.com
Stacy M. Berno
Ambios Technology, Inc.
100 Pioneer Street, Suite A
Santa Cruz, California 95060
Copyright © Ambios Technology
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