- About Us
- Career Center
- Nano-Social Network
- Nano Consulting
- My Account
Automated features improve repeatability and time saving functions
The latest software release from Ambios Technology,
Inc. adds sophisticated automated features that improve repeatability and time saving
functions in use with their high resolution optical profilers for the general industrial and
With the new software version (Version 5.5.2) an operator has programming control to preset stage locations for repetitive measurements integral to accurate data acquisition, timely throughput, and decreased errors in operation. With the programmable stage preset functionality, an operator can program up to ten stage positions ensuring repetitive measurements, and allow easier sample interchanging without the need for reprogramming stage position with every load. Other new features include: step detection, auto level, auto measure, scan stitching, and multiple profile loads. These functions enable operators to extend the profile range of the instrument, allowing larger scan lengths, repeat multiple scans with the same parameters, and view analysis data in “batch” format.
The move toward more automated capabilities is in part a response to consumer requests in Research and Development and other markets, as well as a continued company commitment to enhancing its surface analysis products. Ambios Technology’s profilers continue to be an ideal measurement tool in the R&D world, as well as a capable tool in the MEMS and nanotechnology fields.
Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.
|Related News Press|
Scientists found a natural nanostructure to control the flow of light October 4th, 2015
Production of High Temperature Ceramics with Modified Properties in Iran October 2nd, 2015
ISO Approves 2 Int'l Nanotechnology-Related Standards Proposed by Iran October 2nd, 2015
Physicists map the strain, pixel by pixel, in wonder material graphene September 30th, 2015