Nanotechnology Now

Our NanoNews Digest Sponsors





Heifer International

Wikipedia Affiliate Button


android tablet pc

Home > Press > Veeco Instruments SPM Conference and User's Meeting

Abstract:
Scanning Probe Microscopy informal discussion forum

Veeco Instruments Scandinavia SPM Conference and Userís Meeting 2005

February 25, 2005

Veeco designs, manufactures, markets and services a broad line of equipment primarily used to provide critical surface measurements on thin film magnetic heads and disks used in hard drives, as well as on semiconductor wafers and in research applications in the Optical Telecommunications, Data Storage and Semiconductor industries. Veeco Instruments SPM Applications and Users Conference will focus on exciting new SPM imaging modes and applications with speakers from leading Research Groups from Scandinavia with a demonstration focussing on the application of AFM, nanolithography, advanced force curves using for instance scripting and point-and-shoot. The meeting is open to anyone with an interest in Scanning Probe Microscopy and will act as an informal discussion forum.

Location: Helsinki University of Technology, Espoo, Finland

URL: www.veeco-europe.com/uk/index_events.htm

Dates: April 28 - 29, 2005



Contact:
Tanya Dempsey
+44 (0)1954 233901
tdempsey@veeco.co.uk

Copyright © Veeco Instruments

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

Announcements

Rice physicist emerges as leader in quantum materials research: Nevidomskyy wins both NSF CAREER Award and Cottrell Scholar Award August 20th, 2014

Graphene may be key to leap in supercapacitor performance August 20th, 2014

Newly-Developed Nanobiosensor Quickly Diagnoses Cancer August 20th, 2014

Ultrasonic Waves Applied in Production of Graphene Nanosheets August 20th, 2014

Tools

Oxford Instruments Asylum Research Receives the 2014 Microscopy Today Innovation Award for blueDrive Photothermal Excitation August 18th, 2014

Laser makes microscopes way cooler: Cooling a nanowire probe with a laser could lead to substantial improvements in the sensitivity of atomic force probe microscopes August 15th, 2014

JPK reports on the use of AFM and advanced fluorescence microscopy at the University of Freiburg August 13th, 2014

Phasefocus reports on the use of their high-precision Lens Profiler for measuring contact lens thickness at the Brien Holden Vision Institute in Sydney, Australia August 13th, 2014

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More














ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







© Copyright 1999-2014 7th Wave, Inc. All Rights Reserved PRIVACY POLICY :: CONTACT US :: STATS :: SITE MAP :: ADVERTISE