Home > Press > Veeco Instruments SPM Conference and User's Meeting
Abstract:
Scanning Probe Microscopy informal discussion forum
Veeco designs, manufactures, markets and services a broad line of equipment primarily used to provide critical surface measurements on thin film magnetic heads and disks used in hard drives, as well as on semiconductor wafers and in research applications in the Optical Telecommunications, Data Storage and Semiconductor industries. Veeco Instruments SPM Applications and Users Conference will focus on exciting new SPM imaging modes and applications with speakers from leading Research Groups from Scandinavia with a demonstration focussing on the application of AFM, nanolithography, advanced force curves using for instance scripting and point-and-shoot. The meeting is open to anyone with an interest in Scanning Probe Microscopy and will act as an informal discussion forum.
Location: Helsinki University of Technology, Espoo, Finland
URL: www.veeco-europe.com/uk/index_events.htm
Dates: April 28 - 29, 2005
Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.
Related News Press |
Announcements
NRL charters Navy’s quantum inertial navigation path to reduce drift April 5th, 2024
Discovery points path to flash-like memory for storing qubits: Rice find could hasten development of nonvolatile quantum memory April 5th, 2024
Tools
Ferroelectrically modulate the Fermi level of graphene oxide to enhance SERS response November 3rd, 2023
The USTC realizes In situ electron paramagnetic resonance spectroscopy using single nanodiamond sensors November 3rd, 2023
The latest news from around the world, FREE | ||
Premium Products | ||
Only the news you want to read!
Learn More |
||
Full-service, expert consulting
Learn More |
||