Nanotechnology Now

Our NanoNews Digest Sponsors

Heifer International

Wikipedia Affiliate Button

Home > News > SRAMs readied for 45-nm node

February 11th, 2005

SRAMs readied for 45-nm node

Abstract:
Designers from IBM, Samsung, Texas Instruments and Virage Logic laid out design, test and process issues affecting SRAMs in sub-90-nm devices during a panel session. The next threshold is the 65-nm process node, and challenges increase substantially at the 45-nm process node.

Source:
EETimes

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

Chip Technology

Photonic chip guides single photons, even when there are bends in the road February 16th, 2018

Graphene on toast, anyone? Rice University scientists create patterned graphene onto food, paper, cloth, cardboard February 13th, 2018

Liquid crystal molecules form nano rings: Quantized self-assembly enables design of materials with novel properties February 7th, 2018

Nanometrics Selected for Fab-Wide Process Control Metrology by Domestic China 3D-NAND Manufacturer: Latest Fab Win Includes Comprehensive Suite for Substrate, Thin Film and Critical Dimension Metrology February 7th, 2018

Nanoelectronics

Graphene on toast, anyone? Rice University scientists create patterned graphene onto food, paper, cloth, cardboard February 13th, 2018

Vanadium dioxyde: A revolutionary material for tomorrow's electronics: Phase-chance switch can now be performed at higher temperatures February 5th, 2018

Measuring the temperature of two-dimensional materials at the atomic level February 3rd, 2018

Viewing atomic structures of dopant atoms in 3-D relating to electrical activity in a semiconductor December 28th, 2017

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More











ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project