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Home > News > Glimpse Into Tomorrow: Nanotech Metrology

December 27th, 2004

Glimpse Into Tomorrow: Nanotech Metrology

Abstract:
The future of nanotech metrology is being shaped in advanced laboratories such as NIST's Nanoelectronic Device Metrology Project, headed by Curt Richter. The project team is developing metrology to enable new nanotechnologies (such as silicon-based quantum devices, molecular electronics and organic thin-film transistors) to supplement or supplant conventional CMOS devices.

Source:
reed-electronics

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